Micron technology, inc. (20240161854). READ COMMAND FAULT DETECTION IN A MEMORY SYSTEM simplified abstract

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READ COMMAND FAULT DETECTION IN A MEMORY SYSTEM

Organization Name

micron technology, inc.

Inventor(s)

Melissa I. Uribe of El Dorado Hills CA (US)

READ COMMAND FAULT DETECTION IN A MEMORY SYSTEM - A simplified explanation of the abstract

This abstract first appeared for US patent application 20240161854 titled 'READ COMMAND FAULT DETECTION IN A MEMORY SYSTEM

Simplified Explanation

The patent application describes methods, systems, and devices for read command fault detection in a memory system.

  • Memory device sets a field of a register with a first value if a read command has not been decoded, and with a second value if a read command is received and decoded.
  • The value of the field is indicated to the host device, which can then decide whether to process information over the interface between the host device and the memory device.

Potential Applications

This technology could be applied in various memory systems, such as computer RAM, solid-state drives, and embedded systems where read command fault detection is crucial for data integrity.

Problems Solved

This technology helps in detecting faults in read commands, ensuring that data is processed accurately and preventing potential errors in data transmission and storage.

Benefits

The benefits of this technology include improved data reliability, reduced chances of data corruption, and enhanced system stability by detecting and addressing read command faults promptly.

Potential Commercial Applications

The technology could be valuable in industries such as data storage, cloud computing, IoT devices, and telecommunications where reliable memory systems are essential for efficient operations.

Possible Prior Art

One possible prior art could be memory systems with basic error detection mechanisms, but the specific method of using a register field to indicate read command faults may be a novel approach.

Unanswered Questions

How does this technology compare to existing fault detection methods in memory systems?

This article does not provide a direct comparison with existing fault detection methods in memory systems.

What are the potential limitations or challenges in implementing this technology in different memory system architectures?

The article does not address the potential limitations or challenges in implementing this technology in various memory system architectures.


Original Abstract Submitted

methods, systems, and devices for read command fault detection in a memory system are described. for example, a memory device may be configured to set a field of a register with a first value, corresponding to a state where a read command has not been decoded. if the memory device receives and decodes a read command from a host device, the memory device may set the field with a second value. the memory device indicate a value of the field of the register to the host device, which may be used to evaluate whether to process information interpreted over an interface between the host device and the memory device. for example, if the host device receives an indication of the second value, the host device may proceed with processing and, if the host device receives an indication of the first value, the host device may refrain from processing.