Micron technology, inc. (20240126448). ADAPTIVE READ DISTURB SCAN simplified abstract
Contents
- 1 ADAPTIVE READ DISTURB SCAN
ADAPTIVE READ DISTURB SCAN
Organization Name
Inventor(s)
Animesh R. Chowdhury of Boise ID (US)
Kishore K. Muchherla of San Jose CA (US)
Nicola Ciocchini of Boise ID (US)
Jung Sheng Hoei of Newark CA (US)
Niccolo' Righetti of Boise ID (US)
Jonathan S. Parry of Boise ID (US)
ADAPTIVE READ DISTURB SCAN - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240126448 titled 'ADAPTIVE READ DISTURB SCAN
Simplified Explanation
The patent application describes apparatuses, systems, and methods for adapting a read disturb scan. One example method involves determining a delay between a first read command and a second read command, incrementing a read count based on the determined delay, and adapting a read disturb scan rate based on the incremented read count.
- Determining delay between read commands:
- The method involves identifying the time gap between consecutive read commands.
- Incrementing read count based on delay:
- The read count is increased based on the duration of the delay between read commands.
- Adapting read disturb scan rate:
- The read disturb scan rate is adjusted according to the incremented read count.
Potential Applications
This technology could be applied in: - Memory devices - Data storage systems
Problems Solved
- Reducing read disturb in memory devices - Improving data retention in storage systems
Benefits
- Enhanced data integrity - Increased lifespan of memory devices
Potential Commercial Applications
Optimizing read disturb scan in memory devices
Possible Prior Art
Prior art related to adapting read disturb scans in memory devices may exist, but specific examples are not provided in the abstract.
Unanswered Questions
== How does this method compare to existing techniques for read disturb mitigation in memory devices? The article does not provide a comparison with existing techniques for read disturb mitigation.
== What impact could this technology have on the performance of data storage systems? The potential performance improvements in data storage systems due to this technology are not discussed in the article.
Original Abstract Submitted
apparatuses, systems, and methods for adapting a read disturb scan. one example method can include determining a delay between a first read command and a second read command, incrementing a read count based on the determined delay between the first read command and the second read command, and adapting a read disturb scan rate based on the incremented read count.
