Micron Technology, Inc. patent applications published on October 10th, 2024
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Contents
- 1 Patent applications for Micron Technology, Inc. on October 10th, 2024
- 1.1 Conflict Avoidance for Bank-Shared Circuitry that supports Usage-Based Disturbance Mitigation (18627859)
- 1.2 APPARATUS WITH MEMORY BLOCK MANAGEMENT AND METHODS FOR OPERATING THE SAME (18745534)
- 1.3 AUTOMATIC WORDLINE STATUS BYPASS MANAGEMENT (18746987)
- 1.4 WORDLINE LEAKAGE TEST MANAGEMENT (18748715)
- 1.5 Separation of Parity Columns in Bit-Flip Decoding of Low-Density Parity-Check Codes with Pipelining and Column Parallelism (18743629)
- 1.6 SCHEDULING FOR MEMORY (18607283)
- 1.7 MONOLITHIC NON-VOLATILE MEMORY DEVICE USING PERIPHERAL COMPONENT INTERCONNECT EXPRESS INTERFACE FOR EMBEDDED SYSTEM (18621350)
- 1.8 USING MACHINE LEARNING TO GENERATE A WORKLOAD OF A STORAGE COMPONENT (18596108)
- 1.9 MEMORY DEVICE ARCHITECTURE USING MULTIPLE PHYSICAL CELLS PER BIT TO IMPROVE READ MARGIN AND TO ALLEVIATE THE NEED FOR MANAGING DEMARCATION READ VOLTAGES (18749412)
- 1.10 Data Sense Amplifier Circuit with a Hybrid Architecture (18627960)
- 1.11 CONTROLLING PILLAR VOLTAGE USING WORDLINE BOOST VOLTAGE AND SELECT GATE LEAKAGE DURING ALL LEVELS PROGRAMMING OF A MEMORY DEVICE (18625800)
- 1.12 BOOST-BY-DECK DURING A PROGRAM OPERATION ON A MEMORY DEVICE (18604411)
- 1.13 INTERRUPTING A MEMORY BUILT-IN SELF-TEST (18748620)
- 1.14 ADAPTIVE BLOCK FAMILY ERROR AVOIDANCE SCAN BASED ON DYNAMIC PAGE ERROR STATISTICS (18624720)
- 1.15 METHODS OF FORMING MICROELECTRONIC DEVICES INCLUDING VOIDS NEIGHBORING CONDUCTIVE CONTACTS, AND RELATED ELECTRONIC SYSTEMS (18745872)
- 1.16 MICROFEATURE WORKPIECES AND METHODS FOR FORMING INTERCONNECTS IN MICROFEATURE WORKPIECES (18744493)
- 1.17 SEMICONDUCTOR DEVICE WITH A THROUGH DIELECTRIC VIA (18610268)
- 1.18 SEMICONDUCTOR DEVICE ASSEMBLIES AND SYSTEMS WITH IMPROVED THERMAL PERFORMANCE AND METHODS FOR MAKING THE SAME (18745638)
- 1.19 Semiconductor Device for Short Circuit Detection (18618645)
- 1.20 SEMICONDUCTOR DIES WITH ROUNDED OR CHAMFERED EDGES (18624811)
- 1.21 APPARATUS AND ELECTRONIC DEVICES INCLUDING TRANSISTORS COMPRISING TWO-DIMENSIONAL MATERIALS (18743686)
- 1.22 LIGHT-EMITTING METAL-OXIDE-SEMICONDUCTOR DEVICES AND ASSOCIATED SYSTEMS, DEVICES, AND METHODS (18744455)
- 1.23 LIGHT EMITTING DIODES WITH ENHANCED THERMAL SINKING AND ASSOCIATED METHODS OF OPERATION (18743884)
- 1.24 WORDLINE RECESS FORMATION AND RESULTING STRUCTURES (18600324)
- 1.25 Memory Circuitry And Methods Used In Forming Memory Circuitry (18602321)
Patent applications for Micron Technology, Inc. on October 10th, 2024
Main Inventor
Kang-Yong Kim
APPARATUS WITH MEMORY BLOCK MANAGEMENT AND METHODS FOR OPERATING THE SAME (18745534)
Main Inventor
Kyungjin Kim
AUTOMATIC WORDLINE STATUS BYPASS MANAGEMENT (18746987)
Main Inventor
Jiangang Wu
WORDLINE LEAKAGE TEST MANAGEMENT (18748715)
Main Inventor
Wai Leong Chin
Separation of Parity Columns in Bit-Flip Decoding of Low-Density Parity-Check Codes with Pipelining and Column Parallelism (18743629)
Main Inventor
Eyal En Gad
SCHEDULING FOR MEMORY (18607283)
Main Inventor
Chun-Yi Liu
MONOLITHIC NON-VOLATILE MEMORY DEVICE USING PERIPHERAL COMPONENT INTERCONNECT EXPRESS INTERFACE FOR EMBEDDED SYSTEM (18621350)
Main Inventor
Marco REDAELLI
USING MACHINE LEARNING TO GENERATE A WORKLOAD OF A STORAGE COMPONENT (18596108)
Main Inventor
Saideep TIKU
MEMORY DEVICE ARCHITECTURE USING MULTIPLE PHYSICAL CELLS PER BIT TO IMPROVE READ MARGIN AND TO ALLEVIATE THE NEED FOR MANAGING DEMARCATION READ VOLTAGES (18749412)
Main Inventor
Joseph Michael McCrate
Data Sense Amplifier Circuit with a Hybrid Architecture (18627960)
Main Inventor
Yang Lu
CONTROLLING PILLAR VOLTAGE USING WORDLINE BOOST VOLTAGE AND SELECT GATE LEAKAGE DURING ALL LEVELS PROGRAMMING OF A MEMORY DEVICE (18625800)
Main Inventor
Sheyang Ning
BOOST-BY-DECK DURING A PROGRAM OPERATION ON A MEMORY DEVICE (18604411)
Main Inventor
Leo Raimondo
INTERRUPTING A MEMORY BUILT-IN SELF-TEST (18748620)
Main Inventor
Scott E. SCHAEFER
ADAPTIVE BLOCK FAMILY ERROR AVOIDANCE SCAN BASED ON DYNAMIC PAGE ERROR STATISTICS (18624720)
Main Inventor
Yugang Yu
METHODS OF FORMING MICROELECTRONIC DEVICES INCLUDING VOIDS NEIGHBORING CONDUCTIVE CONTACTS, AND RELATED ELECTRONIC SYSTEMS (18745872)
Main Inventor
Darwin A. Clampitt
MICROFEATURE WORKPIECES AND METHODS FOR FORMING INTERCONNECTS IN MICROFEATURE WORKPIECES (18744493)
Main Inventor
William M. Hiatt
SEMICONDUCTOR DEVICE WITH A THROUGH DIELECTRIC VIA (18610268)
Main Inventor
Bharat Bhushan
SEMICONDUCTOR DEVICE ASSEMBLIES AND SYSTEMS WITH IMPROVED THERMAL PERFORMANCE AND METHODS FOR MAKING THE SAME (18745638)
Main Inventor
Hyunsuk Chun
Semiconductor Device for Short Circuit Detection (18618645)
Main Inventor
TOMOHIRO KITANI
SEMICONDUCTOR DIES WITH ROUNDED OR CHAMFERED EDGES (18624811)
Main Inventor
Quang NGUYEN
APPARATUS AND ELECTRONIC DEVICES INCLUDING TRANSISTORS COMPRISING TWO-DIMENSIONAL MATERIALS (18743686)
Main Inventor
Witold Kula
LIGHT-EMITTING METAL-OXIDE-SEMICONDUCTOR DEVICES AND ASSOCIATED SYSTEMS, DEVICES, AND METHODS (18744455)
Main Inventor
Martin F. Schubert
LIGHT EMITTING DIODES WITH ENHANCED THERMAL SINKING AND ASSOCIATED METHODS OF OPERATION (18743884)
Main Inventor
Kevin Tetz
WORDLINE RECESS FORMATION AND RESULTING STRUCTURES (18600324)
Main Inventor
Babak Tahmouresilerd
Memory Circuitry And Methods Used In Forming Memory Circuitry (18602321)
Main Inventor
Shuangqiang Luo
