Micron Technology, Inc. patent applications published on March 14th, 2024
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Summary of the patent applications from Micron Technology, Inc. on March 14th, 2024
Micron Technology, Inc. has recently filed patents for innovative microelectronic devices and integrated circuit technologies. These patents focus on improving transistor functionality, enhancing capacitor performance, and optimizing memory cell arrays for multiplication and accumulation operations. The microelectronic device described in one patent application features a base structure with active regions and isolation regions, along with a transistor structure incorporating high-k materials and lanthanum in the gate electrode stack. Another patent application details an apparatus with multiple capacitors and conductive structures for improved device functionality. Additionally, a patent application describes a digital camera method that adapts to monitor scenes and detect specific conditions using weight matrices and memory cells.
Summary of notable applications:
- Advanced microelectronic devices with improved transistor functionality and reduced leakage currents.
- Enhanced capacitor structures for increased efficiency and reliability in electronic circuits.
- Memory cell arrays optimized for multiplication and accumulation operations in advanced computing systems and artificial intelligence hardware.
- Digital camera technology for object detection and recognition in surveillance systems, medical imaging devices, and autonomous vehicles.
Contents
- 1 Patent applications for Micron Technology, Inc. on March 14th, 2024
- 1.1 CONVERSION OF ACCESS DATA BASED ON MEMORY DEVICE SIZE (17944509)
- 1.2 READ DISTURB MANAGEMENT FOR MEMORY (17931416)
- 1.3 MANAGEMENT OF ERROR-HANDLING FLOWS IN MEMORY DEVICES USING PROBABILITY DATA STRUCTURE (17943082)
- 1.4 MEMORY PATTERN MANAGEMENT FOR IMPROVED DATA RETENTION IN MEMORY DEVICES (18237668)
- 1.5 MEMORY CHANNEL DISABLEMENT (17944572)
- 1.6 SEQUENCE ALIGNMENT WITH MEMORY ARRAYS (17931262)
- 1.7 DATA SENSING WITH ERROR CORRECTION (18243344)
- 1.8 ENHANCED WRITE PERFORMANCE UTILIZING PROGRAM INTERLEAVE (18513742)
- 1.9 SELF-SCHEDULING THREADS IN A PROGRAMMABLE ATOMIC UNIT (18378281)
- 1.10 MULTI-LAYER CODE RATE ARCHITECTURE FOR COPYBACK BETWEEN PARTITIONS WITH DIFFERENT CODE RATES (18511698)
- 1.11 MEMORY ACCESS STATISTICS MONITORING (18512850)
- 1.12 MEMORY SUB-SYSTEM WRITE SEQUENCE TRACK (18519311)
- 1.13 VIRTUAL AND PHYSICAL EXTENDED MEMORY ARRAY (17941592)
- 1.14 HIGH BANDWIDTH GATHER CACHE (18517866)
- 1.15 LOADING DATA IN A TIERED MEMORY SYSTEM (17941704)
- 1.16 LATENCY REDUCTION USING STREAM CACHE (18508141)
- 1.17 DATA INTEGRITY PROTECTION FOR RELOCATING DATA IN A MEMORY SYSTEM (18513197)
- 1.18 INPUT/OUTPUT SEQUENCER INSTRUCTION SET PROCESSING (18510574)
- 1.19 CONNECTIVITY IN COARSE GRAINED RECONFIGURABLE ARCHITECTURE (18388784)
- 1.20 STEP-AHEAD SPIKING NEURAL NETWORK (17903923)
- 1.21 Artificial Neural Network Computation using Integrated Circuit Devices having Analog Inference Capability (17940845)
- 1.22 Redundant Computations using Integrated Circuit Devices having Analog Inference Capability (17940915)
- 1.23 Balance Accuracy and Power Consumption in Integrated Circuit Devices having Analog Inference Capability (17940717)
- 1.24 Surveillance Cameras Implemented using Integrated Circuit Devices having Analog Inference Capability (17940929)
- 1.25 AUTOMATIC COLLECTION OF AUTONOMOUS VEHICLE LOGGING DATA (18307723)
- 1.26 MATRIX FORMATION FOR PERFORMING COMPUTATIONAL OPERATIONS IN MEMORY (17944390)
- 1.27 Synchronous Input Buffer Control Using a Ripple Counter (17930655)
- 1.28 Model Inversion in Integrated Circuit Devices having Analog Inference Capability (17940935)
- 1.29 TEST MODE SECURITY CIRCUIT (17942944)
- 1.30 SEQUENCE ALIGNMENT WITH MEMORY ARRAYS (17931277)
- 1.31 ADAPTIVE PRE-READ MANAGEMENT IN MULTI-PASS PROGRAMMING (17941831)
- 1.32 Weight Calibration Check for Integrated Circuit Devices having Analog Inference Capability (17940945)
- 1.33 READ LEVEL COMPENSATION FOR PARTIALLY PROGRAMMED BLOCKS OF MEMORY DEVICES (17942977)
- 1.34 BUILT-IN SELF-TEST CIRCUITRY (17944135)
- 1.35 BUILT-IN SELF-TEST BURST PATTERNS BASED ON ARCHITECTURE OF MEMORY (17943706)
- 1.36 Methods of Forming One or More Covered Voids in a Semiconductor Substrate, Methods of Forming Field Effect Transistors, Methods of Forming Semiconductor-on-Insulator Substrates, Methods of Forming a Span Comprising Silicon Dioxide, Methods of Cooling Semiconductor Devices, Methods of Forming Electromagnetic Radiation Emitters and Conduits, Methods of Forming Imager Systems, Methods of Forming Nanofluidic Channels, Fluorimetry Methods, and Integrated Circuitry ([[18518271. Methods of Forming One or More Covered Voids in a Semiconductor Substrate, Methods of Forming Field Effect Transistors, Methods of Forming Semiconductor-on-Insulator Substrates, Methods of Forming a Span Comprising Silicon Dioxide, Methods of Cooling Semiconductor Devices, Methods of Forming Electromagnetic Radiation Emitters and Conduits, Methods of Forming Imager Systems, Methods of Forming Nanofluidic Channels, Fluorimetry Methods, and Integrated Circuitry simplified abstract (Micron Technology, Inc.)|18518271]])
- 1.37 FRONT END OF LINE INTERCONNECT STRUCTURES AND ASSOCIATED SYSTEMS AND METHODS (18507721)
- 1.38 MICROELECTRONIC DEVICES INCLUDING STAIRCASE STRUCTURES, AND RELATED METHODS, MEMORY DEVICES, AND ELECTRONIC SYSTEMS (17930656)
- 1.39 ACCESS CIRCUITRY STRUCTURES FOR THREE-DIMENSIONAL MEMORY ARRAY (17940715)
- 1.40 EMBEDDED METAL PADS (17943580)
- 1.41 TIGHTLY-COUPLED RANDOM ACCESS MEMORY INTERFACE SHIM DIE (17943104)
- 1.42 OVER-SCULPTED STORAGE NODE (17944649)
- 1.43 Image Enhancement using Integrated Circuit Devices having Analog Inference Capability (17940863)
- 1.44 Image Compression using Integrated Circuit Devices having Analog Inference Capability (17940889)
- 1.45 Image Sensor with Analog Inference Capability (17940822)
- 1.46 Memory Usage Configurations for Integrated Circuit Devices having Analog Inference Capability (17940937)
- 1.47 Monitoring of User-Selected Conditions (17940955)
- 1.48 APPARATUS COMPRISING A METAL PORTION IN THE TOP PORTION OF CAPACITOR STRUCTURE, AND RELATED METHODS (17931717)
- 1.49 MICROELECTRONIC DEVICES, AND RELATED MEMORY DEVICES, ELECTRONIC SYSTEMS, AND METHODS (17931430)
Patent applications for Micron Technology, Inc. on March 14th, 2024
CONVERSION OF ACCESS DATA BASED ON MEMORY DEVICE SIZE (17944509)
Main Inventor
Mow Yiak Goh
READ DISTURB MANAGEMENT FOR MEMORY (17931416)
Main Inventor
Francesco Basso
MANAGEMENT OF ERROR-HANDLING FLOWS IN MEMORY DEVICES USING PROBABILITY DATA STRUCTURE (17943082)
Main Inventor
Aswin Thiruvengadam
MEMORY PATTERN MANAGEMENT FOR IMPROVED DATA RETENTION IN MEMORY DEVICES (18237668)
Main Inventor
Guang Hu
MEMORY CHANNEL DISABLEMENT (17944572)
Main Inventor
Yang Lu
SEQUENCE ALIGNMENT WITH MEMORY ARRAYS (17931262)
Main Inventor
Justin Eno
DATA SENSING WITH ERROR CORRECTION (18243344)
Main Inventor
Mauro Castelli
ENHANCED WRITE PERFORMANCE UTILIZING PROGRAM INTERLEAVE (18513742)
Main Inventor
Daniel J. Hubbard
SELF-SCHEDULING THREADS IN A PROGRAMMABLE ATOMIC UNIT (18378281)
Main Inventor
Tony Brewer
MULTI-LAYER CODE RATE ARCHITECTURE FOR COPYBACK BETWEEN PARTITIONS WITH DIFFERENT CODE RATES (18511698)
Main Inventor
Mustafa N. Kaynak
MEMORY ACCESS STATISTICS MONITORING (18512850)
Main Inventor
David A. Roberts
MEMORY SUB-SYSTEM WRITE SEQUENCE TRACK (18519311)
Main Inventor
Karl D. Schuh
VIRTUAL AND PHYSICAL EXTENDED MEMORY ARRAY (17941592)
Main Inventor
Donald M. Morgan
HIGH BANDWIDTH GATHER CACHE (18517866)
Main Inventor
Bryan Hornung
LOADING DATA IN A TIERED MEMORY SYSTEM (17941704)
Main Inventor
Sudharshan Sankaran Vazhkudai
LATENCY REDUCTION USING STREAM CACHE (18508141)
Main Inventor
Muthazhagan BALASUBRAMANI
DATA INTEGRITY PROTECTION FOR RELOCATING DATA IN A MEMORY SYSTEM (18513197)
Main Inventor
Lucien J. Bissey
INPUT/OUTPUT SEQUENCER INSTRUCTION SET PROCESSING (18510574)
Main Inventor
Kinyue Szeto
CONNECTIVITY IN COARSE GRAINED RECONFIGURABLE ARCHITECTURE (18388784)
Main Inventor
Bryan Hornung
STEP-AHEAD SPIKING NEURAL NETWORK (17903923)
Main Inventor
Dmitri Yudanov
Artificial Neural Network Computation using Integrated Circuit Devices having Analog Inference Capability (17940845)
Main Inventor
Poorna Kale
Redundant Computations using Integrated Circuit Devices having Analog Inference Capability (17940915)
Main Inventor
Poorna Kale
Balance Accuracy and Power Consumption in Integrated Circuit Devices having Analog Inference Capability (17940717)
Main Inventor
Poorna Kale
Surveillance Cameras Implemented using Integrated Circuit Devices having Analog Inference Capability (17940929)
Main Inventor
Poorna Kale
AUTOMATIC COLLECTION OF AUTONOMOUS VEHICLE LOGGING DATA (18307723)
Main Inventor
Junichi Sato
MATRIX FORMATION FOR PERFORMING COMPUTATIONAL OPERATIONS IN MEMORY (17944390)
Main Inventor
Paolo Fantini
Synchronous Input Buffer Control Using a Ripple Counter (17930655)
Main Inventor
Brian W. Huber
Model Inversion in Integrated Circuit Devices having Analog Inference Capability (17940935)
Main Inventor
Poorna Kale
TEST MODE SECURITY CIRCUIT (17942944)
Main Inventor
Kari Crane
SEQUENCE ALIGNMENT WITH MEMORY ARRAYS (17931277)
Main Inventor
Justin Eno
ADAPTIVE PRE-READ MANAGEMENT IN MULTI-PASS PROGRAMMING (17941831)
Main Inventor
Kishore Kumar Muchherla
Weight Calibration Check for Integrated Circuit Devices having Analog Inference Capability (17940945)
Main Inventor
Poorna Kale
READ LEVEL COMPENSATION FOR PARTIALLY PROGRAMMED BLOCKS OF MEMORY DEVICES (17942977)
Main Inventor
Nagendra Prasad Ganesh Rao
BUILT-IN SELF-TEST CIRCUITRY (17944135)
Main Inventor
William Yu
BUILT-IN SELF-TEST BURST PATTERNS BASED ON ARCHITECTURE OF MEMORY (17943706)
Main Inventor
William Yu
Methods of Forming One or More Covered Voids in a Semiconductor Substrate, Methods of Forming Field Effect Transistors, Methods of Forming Semiconductor-on-Insulator Substrates, Methods of Forming a Span Comprising Silicon Dioxide, Methods of Cooling Semiconductor Devices, Methods of Forming Electromagnetic Radiation Emitters and Conduits, Methods of Forming Imager Systems, Methods of Forming Nanofluidic Channels, Fluorimetry Methods, and Integrated Circuitry ([[18518271. Methods of Forming One or More Covered Voids in a Semiconductor Substrate, Methods of Forming Field Effect Transistors, Methods of Forming Semiconductor-on-Insulator Substrates, Methods of Forming a Span Comprising Silicon Dioxide, Methods of Cooling Semiconductor Devices, Methods of Forming Electromagnetic Radiation Emitters and Conduits, Methods of Forming Imager Systems, Methods of Forming Nanofluidic Channels, Fluorimetry Methods, and Integrated Circuitry simplified abstract (Micron Technology, Inc.)|18518271]])
Main Inventor
David H. Wells
FRONT END OF LINE INTERCONNECT STRUCTURES AND ASSOCIATED SYSTEMS AND METHODS (18507721)
Main Inventor
Kyle K. Kirby
MICROELECTRONIC DEVICES INCLUDING STAIRCASE STRUCTURES, AND RELATED METHODS, MEMORY DEVICES, AND ELECTRONIC SYSTEMS (17930656)
Main Inventor
Lifang Xu
ACCESS CIRCUITRY STRUCTURES FOR THREE-DIMENSIONAL MEMORY ARRAY (17940715)
Main Inventor
Collin Howder
EMBEDDED METAL PADS (17943580)
Main Inventor
Tsung Han Chiang
TIGHTLY-COUPLED RANDOM ACCESS MEMORY INTERFACE SHIM DIE (17943104)
Main Inventor
Ameen D. Akel
OVER-SCULPTED STORAGE NODE (17944649)
Main Inventor
Devesh Dadhich Shreeram
Image Enhancement using Integrated Circuit Devices having Analog Inference Capability (17940863)
Main Inventor
Poorna Kale
Image Compression using Integrated Circuit Devices having Analog Inference Capability (17940889)
Main Inventor
Poorna Kale
Image Sensor with Analog Inference Capability (17940822)
Main Inventor
Poorna Kale
Memory Usage Configurations for Integrated Circuit Devices having Analog Inference Capability (17940937)
Main Inventor
Poorna Kale
Monitoring of User-Selected Conditions (17940955)
Main Inventor
Poorna Kale
APPARATUS COMPRISING A METAL PORTION IN THE TOP PORTION OF CAPACITOR STRUCTURE, AND RELATED METHODS (17931717)
Main Inventor
Harutaka Honda
MICROELECTRONIC DEVICES, AND RELATED MEMORY DEVICES, ELECTRONIC SYSTEMS, AND METHODS (17931430)
Main Inventor
Yoshikazu Moriwaki
