Kabushiki kaisha toshiba (20240319215). INSPECTION SYSTEM AND INSPECTION METHOD simplified abstract
Contents
INSPECTION SYSTEM AND INSPECTION METHOD
Organization Name
Inventor(s)
Ryota Sekiya of Kamakura Kanagawa (JP)
INSPECTION SYSTEM AND INSPECTION METHOD - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240319215 titled 'INSPECTION SYSTEM AND INSPECTION METHOD
The inspection system described in the patent application includes multiple units for measuring and determining the presence of a predetermined object in a target using machine learning models.
- First measurement unit measures the target.
- First determination unit uses a machine learning model to determine if the target contains the predetermined object based on the measurement result.
- Second measurement unit also measures the target.
- Second determination unit makes a second determination on the presence of the predetermined object based on the measurement result.
- Processing unit generates update data for the machine learning model based on the second determination.
Potential Applications: - Quality control in manufacturing processes. - Security screening in airports or other high-security areas. - Medical imaging for identifying specific anomalies in scans.
Problems Solved: - Efficient and accurate identification of specific objects in a target. - Automation of inspection processes. - Improved decision-making based on measurement data.
Benefits: - Increased accuracy in identifying objects. - Time and cost savings in inspection procedures. - Enhanced security measures in various industries.
Commercial Applications: Title: Advanced Inspection System for Enhanced Object Detection This technology can be utilized in industries such as manufacturing, security, and healthcare for improved quality control, security screening, and medical diagnostics. The market implications include increased efficiency, accuracy, and reliability in inspection processes.
Questions about the technology: 1. How does the use of machine learning models improve the accuracy of object detection in the inspection system? 2. What are the potential challenges in implementing this advanced inspection system in different industries?
Original Abstract Submitted
according to one embodiment, an inspection system includes a first measurement unit for measuring a target, a first determination unit for making a first determination on whether the target includes a predetermined object using a first machine learning model based on a measurement result by the first measurement unit, a second measurement unit for measuring the target, a second determination unit for making a second determination on whether the target includes the predetermined object based on a measurement result by the second measurement unit, and a processing unit for generating first update data of the first machine learning model based on the second determination.
