Kabushiki kaisha toshiba (20240310404). SENSOR AND ELECTRONIC DEVICE simplified abstract

SENSOR AND ELECTRONIC DEVICE

Organization Name

kabushiki kaisha toshiba

Inventor(s)

Kei Masunishi of Kawasaki Kanagawa (JP)

Etsuji Ogawa of Kawasaki Kanagawa (JP)

Yasushi Tomizawa of Fuchu Tokyo (JP)

Fumito Miyazaki of Yokohama Kanagawa (JP)

Daiki Ono of Yokohama Kanagawa (JP)

Kengo Uchida of Kawasaki Kanagawa (JP)

Jumpei Ogawa of Kawasaki Kanagawa (JP)

Fumitaka Ishibashi of Sumida Tokyo (JP)

Hideaki Murase of Yokohama Kanagawa (JP)

SENSOR AND ELECTRONIC DEVICE - A simplified explanation of the abstract

This abstract first appeared for US patent application 20240310404 titled 'SENSOR AND ELECTRONIC DEVICE

Simplified Explanation: The sensor described in the patent application consists of various components such as beams, support portions, linking portions, and connecting portions that work together to detect and measure certain parameters.

Key Features and Innovation:

• The sensor includes beams, support portions, linking portions, and connecting portions.
• The beams are designed in a specific configuration to allow for accurate measurements.
• The linking and connecting portions play a crucial role in the functionality of the sensor.

Potential Applications: The technology could be used in various industries such as automotive, aerospace, robotics, and healthcare for precise measurements and monitoring.

Problems Solved: The sensor addresses the need for accurate and reliable measurement of parameters in different applications.

Benefits:

• Improved accuracy in measurements.
• Enhanced monitoring capabilities.
• Potential for integration into various systems for data collection.

Commercial Applications: The sensor technology could be utilized in industries such as manufacturing, research, and development for quality control and performance optimization.

Prior Art: Readers can explore prior patents related to sensors, beams, and measurement technologies to understand the evolution of such systems.

Frequently Updated Research: Stay updated on advancements in sensor technology, beam configurations, and measurement techniques to enhance the performance of similar systems.

Questions about Sensor Technology: 1. What are the potential limitations of this sensor technology? 2. How does this sensor compare to existing measurement devices in terms of accuracy and reliability?

Original Abstract Submitted

according to one embodiment, a sensor includes a first beam, a first opposing beam, a support portion, a first linking portion, and a first connecting portion. the first beam includes a first portion and a first other portion. a direction from the first portion to the first other portion is along a first direction. a second direction from the first opposing beam to the first beam crosses the first direction. the first opposing beam includes a first opposing portion and a first other opposing portion. the first linking portion is connected to the first other portion and the first other opposing portion. the first connecting portion is connected to the first linking portion. a first connecting portion width along the second direction of the first connecting portion is narrower than a first linking portion width along the second direction of the first linking portion.