Intel corporation (20240220312). INTELLIGENT SENSORS FOR HIGH QUALITY SILICON LIFE CYCLE MANAGEMENT AND EFFICIENT INFIELD TESTING simplified abstract

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INTELLIGENT SENSORS FOR HIGH QUALITY SILICON LIFE CYCLE MANAGEMENT AND EFFICIENT INFIELD TESTING

Organization Name

intel corporation

Inventor(s)

Rakesh Kandula of Doddakannelli (IN)

Shlomo Avni of Ein Hamifratz (IL)

Fei Su of Ann Arbor MI (US)

INTELLIGENT SENSORS FOR HIGH QUALITY SILICON LIFE CYCLE MANAGEMENT AND EFFICIENT INFIELD TESTING - A simplified explanation of the abstract

This abstract first appeared for US patent application 20240220312 titled 'INTELLIGENT SENSORS FOR HIGH QUALITY SILICON LIFE CYCLE MANAGEMENT AND EFFICIENT INFIELD TESTING

Simplified Explanation: The patent application describes methods and apparatus for intelligent sensors used in high-quality silicon life cycle management and efficient infield testing. The sensors detect events based on signals and configuration data, generating interrupts when necessary.

  • Intelligent sensors for silicon life cycle management
  • Efficient infield testing capabilities
  • Configuration data stored in registers
  • Sensor event detection logic circuitry
  • Interrupt generator logic circuitry
  • Event detection based on sensor signals and configuration data

Potential Applications: 1. Semiconductor manufacturing 2. Quality control in electronics production 3. Industrial automation 4. IoT devices 5. Automotive industry

Problems Solved: 1. Ensuring high-quality silicon life cycle management 2. Streamlining infield testing processes 3. Enhancing event detection accuracy 4. Improving interrupt generation efficiency

Benefits: 1. Increased reliability in sensor operations 2. Faster and more accurate event detection 3. Enhanced overall system performance 4. Cost-effective silicon life cycle management 5. Improved testing efficiency

Commercial Applications: Intelligent sensors for high-quality silicon life cycle management can revolutionize the semiconductor industry by improving production processes, ensuring product quality, and reducing testing time and costs.

Questions about Intelligent Sensors for Silicon Life Cycle Management: 1. How do intelligent sensors improve the efficiency of infield testing? 2. What are the key benefits of using intelligent sensors in silicon life cycle management?

Frequently Updated Research: Researchers are continually exploring new ways to enhance the capabilities of intelligent sensors for silicon life cycle management, focusing on improving event detection algorithms and integration with IoT systems.


Original Abstract Submitted

methods and apparatus relating to intelligent sensors for high quality silicon life cycle management as well as efficient infield structural and/or functional testing are described. in an embodiment, one or more registers store configuration data. a sensor having sensor event detection logic circuitry detects an event based at least in part on one or more sensor signals and the stored configuration data. the sensor event detection logic circuitry generates a signal to cause interrupt generator logic circuitry of the sensor to generate an interrupt. other embodiments are also disclosed and claimed.