IQM FINLAND OY (20240412093). CHARACTERIZATION OF QUBIT ENVIRONMENT

From WikiPatents
Jump to navigation Jump to search

CHARACTERIZATION OF QUBIT ENVIRONMENT

Organization Name

IQM FINLAND OY

Inventor(s)

Miha Papic of Munich (DE)

Inés De Vega of Munich (DE)

CHARACTERIZATION OF QUBIT ENVIRONMENT

This abstract first appeared for US patent application 20240412093 titled 'CHARACTERIZATION OF QUBIT ENVIRONMENT



Original Abstract Submitted

there is provided a method for obtaining information on one or more error sources affecting dynamics of at least one qubit, the method comprising: receiving at least one characterizing measurement of at least one qubit configured to act as a sensor for the one or more error sources affecting dynamics of the at least one qubit; determining, based on the at least one characterizing measurement, at least one characterizing signal, which describes the dynamics of the at least one qubit; providing the at least one characterizing signal as an input to a neural network trained to predict information on the one or more error sources affecting the at least one characterizing signal; and receiving as an output, from the neural network, information on the one or more error sources affecting the at least one characterizing signal.