Huawei technologies co., ltd. (20240214838). MEASUREMENT METHOD, APPARATUS, AND SYSTEM simplified abstract
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MEASUREMENT METHOD, APPARATUS, AND SYSTEM
Organization Name
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MEASUREMENT METHOD, APPARATUS, AND SYSTEM - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240214838 titled 'MEASUREMENT METHOD, APPARATUS, AND SYSTEM
The abstract of this patent application describes a method, apparatus, and system for optimizing layer 1 measurements when they overlap with layer 3 measurements, reducing measurement delays.
- Simplified Explanation:
- The patent application introduces a method to prioritize layer 1 measurements over layer 3 measurements when they overlap, reducing delays.
- Key Features and Innovation:
- Method to obtain parameters for layer 1 measurements and determine duration for prioritizing them. - Apparatus for implementing the measurement method. - System for managing layer 1 and layer 3 measurements efficiently.
- Potential Applications:
- Telecommunications industry for network optimization. - IoT devices for improved data collection. - Industrial automation for real-time monitoring.
- Problems Solved:
- Addressing delays in layer 1 measurements. - Efficient resource allocation for different measurement layers.
- Benefits:
- Reduced measurement delays. - Improved accuracy of layer 1 measurements. - Enhanced overall network performance.
- Commercial Applications:
- "Optimizing Layer 1 Measurements for Efficient Network Performance in Telecommunications and IoT Devices"
- Prior Art:
- Readers can explore prior patents related to network measurement optimization in the telecommunications industry.
- Frequently Updated Research:
- Stay updated on advancements in network measurement technologies for further improvements.
Questions about Layer 1 Measurement Optimization: 1. How does this method improve the efficiency of network measurements? 2. What are the potential implications of prioritizing layer 1 measurements over layer 3 measurements?
Original Abstract Submitted
embodiments of this application provide a measurement method, an apparatus, and a system, so that when a time domain resource for layer 1 measurement and a configured time domain resource for layer 3 measurement overlap, the layer 1 measurement can be preferentially performed, thereby reducing a layer 1 measurement delay. the method includes: a terminal device obtains a first parameter associated with a first portion of a first time resource for a layer 1 measurement to a second time domain resource for a layer 3 measurement, determines first duration based on the first parameter perform the layer 1 measurement.
