HITACHI HIGH-TECH CORPORATION patent applications published on October 10th, 2024

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Summary of the patent applications from HITACHI HIGH-TECH CORPORATION on October 10th, 2024

1. **Summary**: The recent patents filed by the organization focus on innovative technologies in mass analyzer control, semiconductor manufacturing chamber diagnostics, and secure information management systems. These patents aim to enhance sensitivity in mass analysis, identify performance variations in semiconductor manufacturing chambers, and improve information security in automated analyzers. The technologies offer solutions to prevent sensitivity reduction, streamline maintenance processes, and mitigate unauthorized access risks.

2. **Key Points of Patents**: - The method adjusts data collection time based on space charge or sensitivity reduction in mass analyzers. - The semiconductor manufacturing chamber diagnostic system analyzes performance differences in chambers. - The secure information management system issues warnings or adjusts access rights upon detecting unauthorized use.

3. **Notable Applications**: - Mass analyzer control technology can be applied in mass spectrometry, analytical chemistry, and pharmaceutical research. - Semiconductor manufacturing chamber diagnostic system can enhance quality control and predictive maintenance in semiconductor manufacturing. - Secure information management system is beneficial for medical laboratories, research institutions, and data management companies to safeguard sensitive information.



Patent applications for HITACHI HIGH-TECH CORPORATION on October 10th, 2024

ELECTROPHORESIS ASSISTANCE METHOD (18578036)

Main Inventor

Hirokazu KATO


Analysis Apparatus Column Oven (18746342)

Main Inventor

Makoto NOGAMI


Information Management System and Information Management Method (18713243)

Main Inventor

Aika NAKAJIMA


APPARATUS DIAGNOSTIC APPARATUS, SEMICONDUCTOR MANUFACTURING APPARATUS SYSTEM, AND SEMICONDUCTOR APPARATUS MANUFACTURING SYSTEM (18027200)

Main Inventor

Satoru Matsukura


METHOD FOR CONTROLLING MASS SPECTROMETER, AND MASS SPECTROMETER (18713248)

Main Inventor

Tsugunao TOMA