HITACHI, LTD. (20240428510). VISUAL INSPECTION METHOD
Contents
VISUAL INSPECTION METHOD
Organization Name
Inventor(s)
Masato Tamura of Santa Clara CA (US)
Ravigopal Vennelakanti of San Jose CA (US)
Rahul Vishwakarma of Berkeley CA (US)
Malarvizhi Sankaranarayanasamy of Mountain View CA (US)
VISUAL INSPECTION METHOD
This abstract first appeared for US patent application 20240428510 titled 'VISUAL INSPECTION METHOD
Original Abstract Submitted
generating a 3d attention model from use of a trained classifier configured to generate an attention map from 2d image frames and a 3d reconstruction process configured to generate a 3d reconstructed representation from the 2d image frames, which can involve, for an input of the 2d image frames creating, through a 3d reconstruction process, the 3d reconstructed representation using the 2d image frames after data collection of an inspection process, the 3d reconstructed representation associated with a mapping to the 2d image frames; executing the trained classifier on the 2d image frames of the video to generate attention maps of the 2d image frames; projecting the attention maps of the 2d image frames to the 3d reconstructed representation based on the mapping to the 2d image frames; and storing the 3d attention model involving the associated 3d attention maps and the 3d reconstructed representation.
