Fujifilm corporation (20250083143). EXAMINATION APPARATUS
Contents
EXAMINATION APPARATUS
Organization Name
Inventor(s)
Tatsuyuki Denawa of Kanagawa (JP)
EXAMINATION APPARATUS
This abstract first appeared for US patent application 20250083143 titled 'EXAMINATION APPARATUS
Original Abstract Submitted
an examination apparatus includes a linear transport passage that transports both cartridges of a cartridge for pre-treatment which is used for a pre-treatment, and which has a cell for pre-treatment accommodating a specimen and a pre-treatment liquid, and the cartridge for measurement, the transport passage being capable of transporting the cartridge for pre-treatment while performing the pre-treatment on the specimen; and a specimen transfer mechanism that transfers the pre-treated specimen in which the pre-treatment is completed, from the cartridge for pre-treatment transported at any position between, in the transport passage, a specimen dispensing position where the specimen is dispensed into the reaction cell of the cartridge for measurement and a detection position where an examination target substance in the specimen is optically detected in a downstream of the transport passage in a transport direction, to the cartridge for measurement disposed at the specimen dispensing position.
