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Category:Yu-Ann Lai of Hsin-Chu (TW)

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Yu-Ann Lai

Yu-Ann Lai from Hsin-Chu (TW) has applied for patents in technology areas such as G01R31/26, G01R31/27, H03K3/017 with taiwan semiconductor manufacturing company, ltd..

Patents

GAN RELIABILITY BUILT-IN SELF TEST (BIST) APPARATUS AND METHOD FOR QUALIFYING DYNAMIC ON-STATE RESISTANCE DEGRADATION (20250060404)

Pages in category "Yu-Ann Lai of Hsin-Chu (TW)"

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T

Taiwan semiconductor manufacturing company, ltd. (20250060404). GAN RELIABILITY BUILT-IN SELF TEST (BIST) APPARATUS AND METHOD FOR QUALIFYING DYNAMIC ON-STATE RESISTANCE DEGRADATION

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