Category:Yoel Feler

Yoel Feler

Executive Summary

Yoel Feler is an inventor who has filed 3 patents. Their primary areas of innovation include Subject of image; Context of image processing (2 patents), PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR; (phototypographic composing devices (1 patents), {for microlithography (measuring printed patterns for monitoring overlay (1 patents), and they have worked with companies such as KLA Corporation (3 patents). Their most frequent collaborators include (2 collaborations), (1 collaborations), (1 collaborations).

Patent Filing Activity

Technology Areas

List of Technology Areas

• G06T2207/30148 (Subject of image; Context of image processing): 2 patents
• G03F7/70633 (PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR; (phototypographic composing devices): 1 patents
• G03F9/7076 ({for microlithography (measuring printed patterns for monitoring overlay): 1 patents
• G06T7/33 (using feature-based methods): 1 patents
• G01B11/272 (MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS): 1 patents
• G06T7/0004 ({Industrial image inspection}): 1 patents
• G01B11/24 (MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS): 1 patents

Companies

List of Companies

• KLA Corporation: 3 patents

Collaborators

• Mark Ghinovker (2 collaborations)
• Diana Shaphirov (1 collaborations)
• Evgeni Gurevich (1 collaborations)
• Vladimir Levinski (1 collaborations)