Category:Vladimir Levinski

Vladimir Levinski

Executive Summary

Vladimir Levinski is an inventor who has filed 4 patents. Their primary areas of innovation include PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR; (phototypographic composing devices (2 patents), using feature-based methods (1 patents), Image enhancement or restoration (1 patents), and they have worked with companies such as KLA Corporation (4 patents). Their most frequent collaborators include (2 collaborations), (1 collaborations), (1 collaborations).

Patent Filing Activity

Technology Areas

List of Technology Areas

• G03F7/70633 (PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR; (phototypographic composing devices): 2 patents
• G06T7/73 (using feature-based methods): 1 patents
• G06T5/002 (Image enhancement or restoration): 1 patents
• G06T7/0004 ({Industrial image inspection}): 1 patents
• G03F9/7076 ({for microlithography (measuring printed patterns for monitoring overlay): 1 patents
• G06T7/33 (using feature-based methods): 1 patents
• G06T2207/30148 (Subject of image; Context of image processing): 1 patents
• G01N21/9501 ({Semiconductor wafers (manufacturing processes per se of semiconductor devices implementing a measuring step): 1 patents
• G03F7/70683 (PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR; (phototypographic composing devices): 1 patents
• G01B11/272 (MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS): 1 patents
• G01N21/4788 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms): 1 patents
• G01N21/956 (Inspecting patterns on the surface of objects {(contactless testing of electronic circuits): 1 patents
• G01B2210/56 (MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS): 1 patents

Companies

List of Companies

• KLA Corporation: 4 patents

Collaborators

• Daria Negri (2 collaborations)
• Nireekshan K. Reddy (1 collaborations)
• Yoel Feler (1 collaborations)
• Mark Ghinovker (1 collaborations)
• Diana Shaphirov (1 collaborations)
• Evgeni Gurevich (1 collaborations)
• Amnon Manassen (1 collaborations)
• Itay Gdor (1 collaborations)
• Yuval Lubashevsky (1 collaborations)
• Alon Yagil of Milpitas CA (US) (1 collaborations)
• Nickolai Isakovich of Milpitas CA (US) (1 collaborations)