Category:Toshifumi HONDA

Toshifumi HONDA

Executive Summary

Toshifumi HONDA is an inventor who has filed 4 patents. Their primary areas of innovation include {Specially adapted optical and illumination features} (2 patents), Investigating the presence of flaws or contamination (2 patents), INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms (2 patents), and they have worked with companies such as HITACHI HIGH-TECH CORPORATION (4 patents). Their most frequent collaborators include (3 collaborations), (3 collaborations), (3 collaborations).

Patent Filing Activity

Technology Areas

List of Technology Areas

• G01N21/8806 ({Specially adapted optical and illumination features}): 2 patents
• G01N21/8851 (Investigating the presence of flaws or contamination): 2 patents
• G01N21/93 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms): 2 patents
• G01N2021/8848 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms): 2 patents
• G01B11/2441 (MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS): 1 patents
• G01N21/9505 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms): 1 patents
• H01L21/67288 (Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components {; Apparatus not specifically provided for elsewhere (processes per se): 1 patents
• G01N21/9501 ({Semiconductor wafers (manufacturing processes per se of semiconductor devices implementing a measuring step): 1 patents
• G06T7/60 (Analysis of geometric attributes): 1 patents
• G06T7/70 (Determining position or orientation of objects or cameras (camera calibration): 1 patents
• G01N2201/103 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms): 1 patents
• G01N2201/1087 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms): 1 patents
• G01N2201/121 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms): 1 patents
• H04N23/67 (Focus control based on electronic image sensor signals): 1 patents

Companies

List of Companies

• HITACHI HIGH-TECH CORPORATION: 4 patents

Collaborators

• Yuta URANO (3 collaborations)
• Eiji ARIMA (3 collaborations)
• Hiromichi YAMAKAWA (3 collaborations)
• Takeru UTSUGI (1 collaborations)
• Shunichi MATSUMOTO (1 collaborations)
• Masaya YAMAMOTO (1 collaborations)