Category:Shinji HARA

Shinji HARA

Executive Summary

Shinji HARA is an inventor who has filed 7 patents. Their primary areas of innovation include MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY (light sources (2 patents), Electrical features thereof (2 patents), with subsequent division of the substrate into plural individual devices (cutting to change the surface-physical characteristics or shape of semiconductor bodies (1 patents), and they have worked with companies such as TDK Corporation (4 patents), TDK CORPORATION (3 patents). Their most frequent collaborators include (7 collaborations), (6 collaborations), (6 collaborations).

Patent Filing Activity

Technology Areas

List of Technology Areas

• G01J2005/202 (MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY (light sources): 2 patents
• G01J5/22 (Electrical features thereof): 2 patents
• H01L21/78 (with subsequent division of the substrate into plural individual devices (cutting to change the surface-physical characteristics or shape of semiconductor bodies): 1 patents
• B32B3/30 (characterised by a layer formed with recesses or projections, e.g. {hollows, grooves, protuberances, ribs (apertured layer): 1 patents
• B32B9/04 (LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM): 1 patents
• B81C1/00904 (Manufacture or treatment of devices or systems in or on a substrate (): 1 patents
• H01L21/6836 ({Wafer tapes, e.g. grinding or dicing support tapes (adhesive tapes in general): 1 patents
• B32B2457/00 (LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM): 1 patents
• H01L2221/68336 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
• H04N25/21 (for transforming thermal infrared radiation into image signals): 1 patents
• H04N25/79 (Arrangements of circuitry being divided between different or multiple substrates, chips or circuit boards, e.g. stacked image sensors): 1 patents
• G01J5/023 (Constructional details): 1 patents
• G01D21/02 (MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR): 1 patents
• G01J5/03 (Arrangements for indicating or recording specially adapted for radiation pyrometers): 1 patents
• G01K7/16 (MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR (radiation pyrometry): 1 patents
• G01L1/225 (using resistance strain gauges): 1 patents
• G01J5/024 (Constructional details): 1 patents
• G01J2005/0077 (MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY (light sources): 1 patents
• G01J2005/206 (MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY (light sources): 1 patents
• G01J5/0853 (Optical arrangements): 1 patents
• G01J5/14 (Electrical features thereof): 1 patents
• G01L1/22 (using resistance strain gauges): 1 patents
• G01N22/00 (Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more (): 1 patents
• H03F3/45071 (Differential amplifiers (differential sense amplifiers): 1 patents
• H01C7/008 (Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material (consisting of loose powdered or granular material): 1 patents
• H01C1/14 (Terminals or tapping points {or electrodes} specially adapted for resistors (in general): 1 patents

Companies

List of Companies

• TDK Corporation: 4 patents
• TDK CORPORATION: 3 patents

Collaborators

• Susumu AOKI (7 collaborations)
• Maiko KOKUBO (6 collaborations)
• Naoki OHTA (6 collaborations)
• Kazuya MAEKAWA (5 collaborations)
• Tadao SENRIUCHI (4 collaborations)
• Yusuke KIMOTO (3 collaborations)
• Takahiro NAKAGAWA (2 collaborations)