Category:Satoshi TAKADA

Satoshi TAKADA

Executive Summary

Satoshi TAKADA is an inventor who has filed 4 patents. Their primary areas of innovation include INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms (2 patents), Subject of image; Context of image processing (2 patents), {Industrial image inspection} (1 patents), and they have worked with companies such as Hitachi High-Tech Corporation (4 patents). Their most frequent collaborators include (2 collaborations), (2 collaborations), (2 collaborations).

Patent Filing Activity

Technology Areas

List of Technology Areas

• G01N2223/6116 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms): 2 patents
• G06T2207/30148 (Subject of image; Context of image processing): 2 patents
• G06T7/0004 ({Industrial image inspection}): 1 patents
• G01N23/223 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms): 1 patents
• G01N2223/646 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms): 1 patents
• G06T2207/10061 (Image acquisition modality): 1 patents
• G06T2207/10116 (Image acquisition modality): 1 patents
• G06T2207/20081 (Special algorithmic details): 1 patents
• G06T7/0008 ({checking presence/absence}): 1 patents
• G06V10/764 (IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING): 1 patents
• G01N23/2251 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms): 1 patents
• H01J37/265 (Electron or ion microscopes; Electron or ion diffraction tubes): 1 patents
• H01J2237/24564 (Measurements of electric or magnetic variables, e.g. voltage, current, frequency): 1 patents
• H01J2237/2806 (ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS (spark-gaps): 1 patents
• H01J37/222 ({Image processing arrangements associated with the tube (image data processing or generation, in general): 1 patents
• H01J37/244 (ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS (spark-gaps): 1 patents
• H01J37/226 (Optical or photographic arrangements associated with the tube {(using a CRT for the display of the image in a scanning electron microscope): 1 patents
• H01J2237/2448 (ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS (spark-gaps): 1 patents

Companies

List of Companies

• Hitachi High-Tech Corporation: 4 patents

Collaborators

• Takehiro HIRAI (2 collaborations)
• Yohei MINEKAWA (2 collaborations)
• Yohei NAKAMURA (2 collaborations)
• Natsuki TSUNO (2 collaborations)
• Naoko TAKEDA (1 collaborations)
• Heita KIMIZUKA (1 collaborations)
• Yasuhiro SHIRASAKI (1 collaborations)
• Minami SHOUJI (1 collaborations)
• Daisuke BIZEN (1 collaborations)
• Makoto SUZUKI (1 collaborations)