Category:Lee D. Whetsel of Parker TX (US)
Lee D. Whetsel
Lee D. Whetsel from Parker TX (US) has applied for patents in technology areas such as G01R31/3177, G01R31/3185, G06F9/30 with texas instruments incorporated.
Patents
Pages in category "Lee D. Whetsel of Parker TX (US)"
The following 13 pages are in this category, out of 13 total.
1
- 18368195. 3D TAP & SCAN PORT ARCHITECTURES simplified abstract (Texas Instruments Incorporated)
- 18524900. INTERPOSER CIRCUIT simplified abstract (TEXAS INSTRUMENTS INCORPORATED)
- 18526497. TSV TESTING simplified abstract (TEXAS INSTRUMENTS INCORPORATED)
- 18734226. 3D STACKED DIE TEST ARCHITECTURE simplified abstract (Texas Instruments Incorporated)
- 18744322. PROGRAMMABLE TEST COMPRESSION ARCHITECTURE INPUT/OUTPUT SHIFT REGISTER simplified abstract (Texas Instruments Incorporated)
- 18956271. SCAN TESTABLE THROUGH SILICON VIAS (TEXAS INSTRUMENTS INCORPORATED)
- 18956830. COMMANDED JTAG TEST ACCESS PORT OPERATIONS (TEXAS INSTRUMENTS INCORPORATED)
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- Texas instruments incorporated (20240319274). 3D STACKED DIE TEST ARCHITECTURE simplified abstract
- Texas instruments incorporated (20240337691). PROGRAMMABLE TEST COMPRESSION ARCHITECTURE INPUT/OUTPUT SHIFT REGISTER simplified abstract
- Texas instruments incorporated (20240345154). INTEGRATED CIRCUIT DIE TEST ARCHITECTURE simplified abstract
- Texas instruments incorporated (20250085343). COMMANDED JTAG TEST ACCESS PORT OPERATIONS
- Texas instruments incorporated (20250087539). SCAN TESTABLE THROUGH SILICON VIAS