Category:Jung Sheng Hoei of Newark CA (US)
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Jung Sheng Hoei of Newark CA (US)
Executive Summary
Jung Sheng Hoei of Newark CA (US) is an inventor who has filed 1 patents. Their primary areas of innovation include Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers (1 patents), Word line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, for word lines (1 patents), Word line organisation; Word line lay-out (1 patents), and they have worked with companies such as Micron Technolgy, Inc. (1 patents). Their most frequent collaborators include (1 collaborations), (1 collaborations), (1 collaborations).
Patent Filing Activity
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Technology Areas
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List of Technology Areas
- G11C7/1096 (Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers): 1 patents
- G11C8/08 (Word line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, for word lines): 1 patents
- G11C8/14 (Word line organisation; Word line lay-out): 1 patents
- G11C16/10 (Programming or data input circuits): 1 patents
Companies
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List of Companies
- Micron Technolgy, Inc.: 1 patents
Collaborators
- Jiangang Wu of Milpitas CA (US) (1 collaborations)
- Lei Zhou (1 collaborations)
- Kishore Kumar Muchherla of Fremont CA (US) (1 collaborations)
- Qisong Lin of El Dorado Hills CA (US) (1 collaborations)
Subcategories
This category has the following 9 subcategories, out of 9 total.
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Pages in category "Jung Sheng Hoei of Newark CA (US)"
The following 12 pages are in this category, out of 12 total.
1
- 17863000. MODIFIED READ COUNTER INCREMENTING SCHEME IN A MEMORY SUB-SYSTEM simplified abstract (Micron Technology, Inc.)
- 17874828. RELIABILITY BASED DATA VERIFICATION simplified abstract (Micron Technology, Inc.)
- 17895886. READ COUNTER ADJUSTMENT FOR DELAYING READ DISTURB SCANS simplified abstract (Micron Technology, Inc.)
- 18419895. MODIFIED READ COUNTER INCREMENTING SCHEME IN A MEMORY SUB-SYSTEM simplified abstract (Micron Technology, Inc.)
- 18505855. MEDIA MANAGEMENT SCANNING WITH UNIFIED CRITERIA TO ALLEVIATE FAST AND LATENT READ DISTURB simplified abstract (Micron Technology, Inc.)
- 18746987. AUTOMATIC WORDLINE STATUS BYPASS MANAGEMENT simplified abstract (Micron Technology, Inc.)
M
- Micron technology, inc. (20240126448). ADAPTIVE READ DISTURB SCAN simplified abstract
- Micron technology, inc. (20240160359). MODIFIED READ COUNTER INCREMENTING SCHEME IN A MEMORY SUB-SYSTEM simplified abstract
- Micron technology, inc. (20240161838). MEDIA MANAGEMENT SCANNING WITH UNIFIED CRITERIA TO ALLEVIATE FAST AND LATENT READ DISTURB simplified abstract
- Micron technology, inc. (20240256444). GENERATING VIRTUAL BLOCKS USING PARTIAL GOOD BLOCKS simplified abstract
- Micron technology, inc. (20240338138). AUTOMATIC WORDLINE STATUS BYPASS MANAGEMENT simplified abstract
