Category:Avner Safrani

Avner Safrani

Executive Summary

Avner Safrani is an inventor who has filed 4 patents. Their primary areas of innovation include Optical or mechanical part {supplementary adjustable parts} (1 patents), PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR; (phototypographic composing devices (1 patents), Software arrangements specially adapted for pattern recognition, e.g. user interfaces or toolboxes therefor (1 patents), and they have worked with companies such as KLA Corporation (4 patents). Their most frequent collaborators include (3 collaborations), (1 collaborations), (1 collaborations).

Patent Filing Activity

Technology Areas

List of Technology Areas

• G01J1/0407 (Optical or mechanical part {supplementary adjustable parts}): 1 patents
• G03F7/70316 (PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR; (phototypographic composing devices): 1 patents
• G06F18/40 (Software arrangements specially adapted for pattern recognition, e.g. user interfaces or toolboxes therefor): 1 patents
• G06F3/0481 (based on specific properties of the displayed interaction object or a metaphor-based environment, e.g. interaction with desktop elements like windows or icons, or assisted by a cursor's changing behaviour or appearance): 1 patents
• G06T11/00 (2D [Two Dimensional] image generation): 1 patents
• G06N20/00 (Machine learning): 1 patents
• G06N5/04 (Inference or reasoning models): 1 patents
• G06F18/24 (Classification techniques): 1 patents
• G06F18/214 (Generating training patterns; Bootstrap methods, e.g. bagging or boosting): 1 patents
• G06T2200/24 (IMAGE DATA PROCESSING OR GENERATION, IN GENERAL): 1 patents
• H01L21/681 (for positioning, orientation or alignment): 1 patents
• H01L21/67259 (Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components {; Apparatus not specifically provided for elsewhere (processes per se): 1 patents
• H01L21/68707 (using mechanical means, e.g. chucks, clamps or pinches {(using elecrostatic chucks): 1 patents
• G01B11/2441 (MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS): 1 patents
• G01B17/06 (MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS): 1 patents
• G01B11/0608 (MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS): 1 patents
• G01N21/9505 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms): 1 patents

Companies

List of Companies

• KLA Corporation: 4 patents

Collaborators

• Amnon Manassen (3 collaborations)
• Andrew V. Hill of Berkeley CA (US) (1 collaborations)
• Yonatan Vaknin (1 collaborations)
• Etay Lavert of Milpitas CA (US) (1 collaborations)
• Yossi Simon of Milpitas CA (US) (1 collaborations)
• Dimitry Sanko of Vallejo CA (US) (1 collaborations)
• Shai Mark (1 collaborations)
• Amir Aizen (1 collaborations)
• Maor Arbit (1 collaborations)
• Yoav Grauer (1 collaborations)
• Shlomo Eisenbach of Milpitas CA (US) (1 collaborations)
• Stephen Hiebert of Milpitas CA (US) (1 collaborations)
• Roel Gronheid (1 collaborations)