Canon kabushiki kaisha (20240161265). INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND STORAGE MEDIUM simplified abstract
Contents
- 1 INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND STORAGE MEDIUM
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND STORAGE MEDIUM - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Unanswered Questions
- 1.11 Original Abstract Submitted
INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND STORAGE MEDIUM
Organization Name
Inventor(s)
Atsushi Nogami of Kawasaki-shi (JP)
INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND STORAGE MEDIUM - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240161265 titled 'INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND STORAGE MEDIUM
Simplified Explanation
The patent application describes an information processing device that detects defects in an input image, extracts features from the defect area, and determines attributes of the defect based on the extracted features.
- Defect detecting unit: Detects defects in an input image.
- Extracting unit: Extracts feature amounts from the defect area.
- Attribute determining unit: Determines attributes of the defect using the extracted features.
Potential Applications
This technology could be applied in industries such as manufacturing, quality control, and medical imaging for automated defect detection and analysis.
Problems Solved
1. Automated defect detection and analysis. 2. Improved accuracy and efficiency in identifying defects in images.
Benefits
1. Increased productivity through automated defect detection. 2. Enhanced quality control processes. 3. Reduction in human error and subjectivity in defect analysis.
Potential Commercial Applications
Automated Defect Detection and Analysis Technology for Enhanced Quality Control Processes
Possible Prior Art
There may be prior art related to image processing techniques for defect detection and analysis, but specific examples are not provided in the abstract.
Unanswered Questions
How does the device handle different types of defects in the input image?
The abstract does not specify how the device distinguishes between various types of defects or if it can detect multiple defects simultaneously.
What is the processing time required for defect detection and attribute determination?
The abstract does not mention the speed at which the device can detect defects and determine their attributes, which could be crucial for real-time applications.
Original Abstract Submitted
there is provided with an information processing device. a defect detecting unit detects a defect of an object in an input image. an extracting unit extracts a feature amount pertaining to a partial image of the defect from the input image, on the basis of a result of detecting the defect. an attribute determining unit determines an attribute of the defect using the feature amount pertaining to the partial image of the defect.
