C3.ai, inc. (20250068158). SYSTEMS AND METHODS FOR PREDICTING MANUFACTURING PROCESS RISKS
Contents
SYSTEMS AND METHODS FOR PREDICTING MANUFACTURING PROCESS RISKS
Organization Name
Inventor(s)
Lila Fridley of Redwood City CA (US)
Henrik Ohlsson of Redwood City CA (US)
Sina Koshfetrat Pakazad of Redwood City CA (US)
SYSTEMS AND METHODS FOR PREDICTING MANUFACTURING PROCESS RISKS
This abstract first appeared for US patent application 20250068158 titled 'SYSTEMS AND METHODS FOR PREDICTING MANUFACTURING PROCESS RISKS
Original Abstract Submitted
the present disclosure provides system, methods, and computer program products for predicting and detecting anomalies in a subsystem of a system. an example method may comprise (a) determining a first plurality of tags that are indicative of an operational performance of the subsystem. the tags can be obtained from (i) a plurality of sensors in the subsystem and (ii) a plurality of sensors in the system that are not in the subsystem. the method may further comprise (b) processing measured values of the first plurality of tags using an autoencoder trained on historical values of the first plurality of tags to generate estimated values of the first plurality of tags; (c) determining whether a difference between the measured values and estimated values meets a threshold; and (d) transmitting an alert that indicates that the subsystem is predicted to experience an anomaly if the difference meets the threshold.
