Apple inc. (20250077384). Debug Trace Fabric for Integrated Circuit
Contents
Debug Trace Fabric for Integrated Circuit
Organization Name
Inventor(s)
Charles J. Fleckenstein of Portland OR (US)
Debug Trace Fabric for Integrated Circuit
This abstract first appeared for US patent application 20250077384 titled 'Debug Trace Fabric for Integrated Circuit
Original Abstract Submitted
a trace network for debugging integrated circuits is disclosed. at least one functional network includes a plurality of components interconnected by a number of network switches, implemented on at least one integrated circuit. a trace network is also implemented on the at least one integrated circuit, and includes a plurality of trace circuits configured to generate trace data based on transactions between ones of the plurality of components. the plurality of trace circuits are coupled to one another by a plurality of trace network switches. the trace circuits are configured to convey the generated trace data to an interface, via the trace network, without using the at least one functional network.
