Apple inc. (20240288306). OPTICAL SYSTEM FOR REFERENCE SWITCHING simplified abstract
Contents
OPTICAL SYSTEM FOR REFERENCE SWITCHING
Organization Name
Inventor(s)
Mark Alan Arbore of Los Altos CA (US)
Gary Shambat of San Francisco CA (US)
Matthew A. Terrel of Campbell CA (US)
OPTICAL SYSTEM FOR REFERENCE SWITCHING - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240288306 titled 'OPTICAL SYSTEM FOR REFERENCE SWITCHING
Simplified Explanation: The patent application describes systems and methods for determining properties of a sample using multiple optical paths and layers of optics to enable simultaneous or non-simultaneous measurements at various locations within the sample.
- Systems and methods for measuring properties of a sample
- Capable of reimagining and resolving multiple optical paths within the sample
- Configured with one or two layers of optics for compactness
- Simplified optics design to reduce errors and manufacturing issues
- Enables multiple simultaneous or non-simultaneous measurements
- Includes an optical spacer window to account for changes in optical paths
Potential Applications: - Quality control in manufacturing processes - Medical diagnostics and imaging - Environmental monitoring - Material analysis and research
Problems Solved: - Complexities in measuring properties of samples - Manufacturing tolerance stack-up problems - Interference-based spectroscopic errors - Inclusion of optical spacer window in measurements
Benefits: - Enhanced accuracy in determining sample properties - Compact system design - Reduced errors and manufacturing issues - Versatile for various applications
Commercial Applications: Title: Advanced Optical Measurement System for Various Industries This technology can be applied in industries such as manufacturing, healthcare, environmental monitoring, and research, offering precise and efficient sample analysis capabilities.
Prior Art: Prior art related to this technology may include patents or research papers on optical measurement systems, spectroscopic analysis methods, and sample imaging techniques.
Frequently Updated Research: Researchers are continually exploring advancements in optical measurement systems, spectroscopic analysis techniques, and sample imaging technologies to enhance accuracy and efficiency in sample analysis.
Questions about Optical Measurement Systems: 1. How do optical spacer windows impact the accuracy of measurements in optical systems? 2. What are the key differences between one-layer and two-layer optics configurations in sample analysis systems?
Original Abstract Submitted
systems and methods for determining one or more properties of a sample are disclosed. the systems and methods disclosed can be capable of measuring along multiple locations and can reimage and resolve multiple optical paths within the sample. the system can be configured with one-layer or two-layers of optics suitable for a compact system. the optics can be simplified to reduce the number and complexity of the coated optical surfaces, etalon effects, manufacturing tolerance stack-up problems, and interference-based spectroscopic errors. the size, number, and placement of the optics can enable multiple simultaneous or non-simultaneous measurements at various locations across and within the sample. moreover, the systems can be configured with an optical spacer window located between the sample and the optics, and methods to account for changes in optical paths due to inclusion of the optical spacer window are disclosed.
