Analog Devices International Unlimited Company (20240275500). APPARATUS AND METHODS FOR ELECTRONIC TESTING USING BEAMFORMING INTEGRATED CIRCUITS AS IMPEDANCE TUNERS simplified abstract
APPARATUS AND METHODS FOR ELECTRONIC TESTING USING BEAMFORMING INTEGRATED CIRCUITS AS IMPEDANCE TUNERS
Organization Name
Analog Devices International Unlimited Company
Inventor(s)
APPARATUS AND METHODS FOR ELECTRONIC TESTING USING BEAMFORMING INTEGRATED CIRCUITS AS IMPEDANCE TUNERS - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240275500 titled 'APPARATUS AND METHODS FOR ELECTRONIC TESTING USING BEAMFORMING INTEGRATED CIRCUITS AS IMPEDANCE TUNERS
Simplified Explanation: The patent application describes apparatus and methods for electronic testing using beamforming integrated circuits (ICs) as impedance tuners. This technology allows for impedance tuning at the output of a device-under-test (DUT) by controlling the gain and phase of transmit channels in a beamforming IC.
- Radio frequency (RF) coupler with through line, first coupled line, and second coupled line
- Beamforming IC with first and second transmit channels for impedance tuning
- Controllable gain and phase of transmit channels for precise impedance tuning at the DUT output
Key Features and Innovation:
- Use of beamforming ICs as impedance tuners in electronic testing setups
- Precise control over gain and phase of transmit channels for impedance tuning
- Integration of RF coupler and beamforming IC for efficient testing of DUTs
Potential Applications:
- Wireless communication testing
- Antenna testing
- Radar system testing
Problems Solved:
- Inefficient impedance tuning in electronic testing setups
- Lack of precise control over impedance at the DUT output
- Complex testing procedures for RF devices
Benefits:
- Improved accuracy in impedance tuning
- Enhanced performance of RF devices
- Streamlined electronic testing processes
Commercial Applications: Potential commercial applications include:
- RF device manufacturing
- Telecommunications industry
- Aerospace and defense sector
Prior Art: Readers can explore prior art related to impedance tuning in electronic testing setups, RF couplers, and beamforming ICs.
Frequently Updated Research: Stay updated on the latest advancements in beamforming IC technology, impedance tuning techniques, and electronic testing methodologies.
Questions about electronic testing using beamforming ICs as impedance tuners: 1. How does the integration of beamforming ICs improve impedance tuning in electronic testing setups? 2. What are the key advantages of using beamforming ICs for impedance tuning compared to traditional methods?
Original Abstract Submitted
apparatus and methods for electronic testing using beamforming integrated circuits (ics) as impedance tuners are disclosed herein. in certain embodiments, an electronic testing setup for a device-under-test (dut) includes a radio frequency (rf) coupler including a through line connected to an output of the dut, a first coupled line coupled to the through line, and a second coupled line coupled to the through line. additionally, the electronic testing setup includes a beamforming ic including a first transmit channel having an output connected to the first coupled line, and a second transmit channel having an output connected to the second coupled line. a gain and a phase of the first transmit channel and a gain and a phase of the second transmit channel are each controllable to provide impedance tuning at the output of the dut.
