Analog Devices, Inc. patent applications published on September 12th, 2024
Jump to navigation
Jump to search
Summary of the patent applications from Analog Devices, Inc. on September 12th, 2024
1. **Summary**: Analog Devices, Inc. has recently filed patents for innovative technologies in the field of electrochemical impedance spectroscopy (EIS) and low noise amplifiers (LNAs). These patents focus on improving signal processing and measurement accuracy in various applications such as battery testing, corrosion monitoring, and communication systems.
2. **Key Points of Patents**:
* The first patent describes a calibration system for EIS current measurement systems, including a calibration resistor, reactive element, and current source for precise resistance and reactance measurements. * The second patent outlines a method for selecting gain values in an EIS current measurement system to enhance signal-to-noise characteristics. * The third patent details an EIS current measurement system for accurate current measurement through an electrochemical cell arrangement.
3. **Notable Applications**:
* Precision calibration of EIS systems for accurate impedance measurements in electronic circuits. * Improved signal-to-noise ratio in EIS systems for battery testing and corrosion monitoring. * Enhanced accuracy in current measurement for battery manufacturing and fuel cell development.
Contents
- 1 Patent applications for Analog Devices, Inc. on September 12th, 2024
- 1.1 MEMS STRESS ISOLATION TECHNOLOGY WITH BACKSIDE ETCHED ISOLATION TRENCHES (18596223)
- 1.2 ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY CURRENT MEASUREMENT SYSTEM (18595248)
- 1.3 ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY CURRENT MEASUREMENT SYSTEM INCLUDING DC CURRENT (18595276)
- 1.4 ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY CURRENT MEASUREMENT SYSTEM GAIN CONTROL (18595294)
- 1.5 ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY CURRENT MEASUREMENT SYSTEM CALIBRATION (18595283)
- 1.6 BROADBAND LOW NOISE AMPLIFIERS WITH INTEGRATED LIMITERS AND FAST RECOVERY TIME (18181321)
Patent applications for Analog Devices, Inc. on September 12th, 2024
MEMS STRESS ISOLATION TECHNOLOGY WITH BACKSIDE ETCHED ISOLATION TRENCHES (18596223)
Main Inventor
Kemiao Jia
ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY CURRENT MEASUREMENT SYSTEM (18595248)
Main Inventor
Atulya Yellepeddi
ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY CURRENT MEASUREMENT SYSTEM INCLUDING DC CURRENT (18595276)
Main Inventor
Brian Harrington
ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY CURRENT MEASUREMENT SYSTEM GAIN CONTROL (18595294)
Main Inventor
Brian Harrington
ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY CURRENT MEASUREMENT SYSTEM CALIBRATION (18595283)
Main Inventor
Brian Harrington
BROADBAND LOW NOISE AMPLIFIERS WITH INTEGRATED LIMITERS AND FAST RECOVERY TIME (18181321)
Main Inventor
Mohammed Ehteshamuddin