20240012039. MICROWAVE SENSOR USING AUTLER-TOWNES SPLITTING simplified abstract (ColdQuanta, Inc.)
Contents
MICROWAVE SENSOR USING AUTLER-TOWNES SPLITTING
Organization Name
Inventor(s)
Evan Salim of Lafayette CO (US)
Dana Zachary Anderson of Boulder CO (US)
Jayson Denney of Golden CO (US)
Farhad Majdeteimouri of Broomfield CO (US)
MICROWAVE SENSOR USING AUTLER-TOWNES SPLITTING - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240012039 titled 'MICROWAVE SENSOR USING AUTLER-TOWNES SPLITTING
Simplified Explanation
The abstract describes a patent application for a microwave sensor that measures the electric-field strength of a microwave field containing quantum particles in an ultra-high vacuum (UHV) cell. The sensor uses a probe laser beam and a coupling laser beam that intersect at a "rydberg" intersection within the UHV cell. Quantum particles within this intersection transition to a pair of rydberg states. By sweeping the frequency of the probe laser beam and analyzing the resulting frequency spectrum, the sensor can determine the frequency difference between Autler-Townes peaks. Based on this frequency difference, the electric-field strength of the microwave field within the rydberg intersection can be determined.
- A microwave sensor measures the electric-field strength of a microwave field populated by quantum particles in a UHV cell.
- The sensor uses a probe laser beam and a coupling laser beam that intersect at a "rydberg" intersection within the UHV cell.
- Quantum particles within the rydberg intersection transition to a pair of rydberg states.
- The frequency of the probe laser beam is swept to capture a frequency spectrum.
- The frequency spectrum is analyzed to determine the frequency difference between Autler-Townes peaks.
- The electric-field strength of the microwave field within the rydberg intersection is determined based on this frequency difference.
Potential Applications
- Quantum physics research and experiments
- Microwave field analysis and characterization
- Ultra-high vacuum systems and processes
Problems Solved
- Accurate measurement of electric-field strength in a microwave field containing quantum particles
- Non-invasive measurement technique in an ultra-high vacuum environment
- Precise determination of Autler-Townes peaks and frequency differences
Benefits
- Enables precise analysis of microwave fields in quantum systems
- Non-destructive measurement technique in ultra-high vacuum conditions
- Provides valuable data for quantum physics research and experiments
Original Abstract Submitted
a microwave sensor determines an electric-field strength of a microwave field populated by quantum particles in an ultra-high vacuum (uhv) cell. a probe laser beam and a coupling laser beam are directed into the uhv cell so that they are generally orthogonal to each other and intersect to define a “rydberg” intersection, so-called as the quantum particles within the rydberg intersection transition to a pair of rydberg states. the frequency of the probe laser beam is swept so that a frequency spectrum of the probe laser beam can be captured. the frequency spectrum is analyzed to determine a frequency difference between autler-townes peaks. the electric-field strength of the microwave field within the rydberg intersection is then determined based on this frequency difference.