18956005. EXAMINATION APPARATUS (FUJIFILM CORPORATION)
Contents
EXAMINATION APPARATUS
Organization Name
Inventor(s)
Tatsuyuki Denawa of Kanagawa (JP)
EXAMINATION APPARATUS
This abstract first appeared for US patent application 18956005 titled 'EXAMINATION APPARATUS
Original Abstract Submitted
An examination apparatus includes a measurement line that performs a measurement process while transporting a cartridge for measurement along a transport passage for measurement, a pre-treatment line that performs a pre-treatment while transporting a cartridge for pre-treatment along a transport passage for pre-treatment, and a specimen transfer mechanism that transfers a pre-treated specimen in which a pre-treatment is completed from the cartridge for pre-treatment in the pre-treatment line to the cartridge for measurement in the measurement line, and the transport passage for pre-treatment and the transport passage for measurement are arranged such that a pre-treatment end position in the transport passage for pre-treatment, at which the pre-treatment is completed, is closer to an upstream side in a transport direction of the transport passage for measurement than a downstream side in the transport direction.
