18814460. TEST APPARATUS AND TEST METHOD (Kioxia Corporation)
Contents
TEST APPARATUS AND TEST METHOD
Organization Name
Inventor(s)
Michiru Hogyoku of Yokohama JP
TEST APPARATUS AND TEST METHOD
This abstract first appeared for US patent application 18814460 titled 'TEST APPARATUS AND TEST METHOD
Original Abstract Submitted
According to one embodiment, in a test apparatus, a controller obtains a threshold voltage of a memory cell by performing first processing on a read characteristic. The first processing is processing of, when a subthreshold region in the read characteristic is defined as a first region, focusing on a second region being a region of a read voltage larger than a maximum read voltage of the first region. The controller calculates a first slope in a first threshold characteristic indicating a relationship between a write voltage and the threshold voltage in the write processing, based on the threshold voltage obtained in the first processing. The controller subtracts the first slope from a slope in a predetermined threshold characteristic to obtain a first slope degradation component.
