18755623. MEASUREMENT DEVICE simplified abstract (Panasonic Intellectual Property Management Co., Ltd.)
Contents
MEASUREMENT DEVICE
Organization Name
Panasonic Intellectual Property Management Co., Ltd.
Inventor(s)
MEASUREMENT DEVICE - A simplified explanation of the abstract
This abstract first appeared for US patent application 18755623 titled 'MEASUREMENT DEVICE
The patent application describes a measurement device that utilizes an interference optical system to generate interference light for detection.
- The measurement device includes a light source, an interference optical system, an optical element, and a photodetector.
- The interference optical system separates light into reference light and irradiation light, causing them to interfere with each other to produce interference light.
- The optical element emits the irradiation light and receives the reflected light.
- The photodetector detects the interference light.
- The interference optical system includes a beam splitter to facilitate the separation of light.
- The device satisfies specific optical path length conditions to ensure accurate measurement.
Potential Applications: - This technology can be used in various industries such as telecommunications, medical imaging, and scientific research for precise measurements. - It can also be applied in quality control processes to ensure accurate and reliable results.
Problems Solved: - The device addresses the need for high-precision measurement tools that can effectively separate and detect interference light.
Benefits: - Improved accuracy and reliability in measurements. - Enhanced performance in various applications requiring interference light detection. - Simplified setup and operation for users.
Commercial Applications: Title: "Advanced Interference Measurement Device for Precision Applications" This technology can be commercialized for industries requiring precise measurements, such as semiconductor manufacturing, aerospace engineering, and environmental monitoring. The device's accuracy and reliability make it a valuable tool for quality control and research purposes.
Questions about the technology: 1. How does the interference optical system in the measurement device contribute to accurate measurements? 2. What are the potential limitations of this technology in real-world applications?
Original Abstract Submitted
A measurement device includes: a light source; an interference optical system that separates light into reference light and irradiation light and causes reflected light and the reference light to interfere with each other to generate interference light; an optical element that emits the irradiation light and receives the reflected light; and a photodetector that detects the interference light. The interference optical system includes a beam splitter. The measurement device satisfies d1≤d2+d3 and d2+d3−d1|≥|d4−d1| where d1 is an optical path length from the beam splitter to the photodetector, d2 is an optical path length from the beam splitter to the optical element, d3 is an optical path length from the optical element to the photodetector, and d4 is an optical path length from the beam splitter to the photodetector via a noise light path inside the interference optical system.
