18748715. WORDLINE LEAKAGE TEST MANAGEMENT simplified abstract (Micron Technology, Inc.)
Contents
WORDLINE LEAKAGE TEST MANAGEMENT
Organization Name
Inventor(s)
Wai Leong Chin of Singapore (SG)
Francis Chee Khai Chew of Singapore (SG)
Trismardawi Tanadi of Folsom CA (US)
Chun Sum Yeung of San Jose CA (US)
Lawrence Dumalag of Folsom CA (US)
Ekamdeep Singh of San Jose CA (US)
WORDLINE LEAKAGE TEST MANAGEMENT - A simplified explanation of the abstract
This abstract first appeared for US patent application 18748715 titled 'WORDLINE LEAKAGE TEST MANAGEMENT
The abstract describes a memory sub-system that conducts a series of wordline leakage tests on different wordline groups within a memory block based on the temperature of the memory block. If the test results meet specific conditions, an action is triggered.
- The memory sub-system performs a first wordline leakage test on a first wordline group in response to the temperature of the memory block being within a certain range.
- After determining the first test result, a second wordline leakage test is conducted on a second wordline group.
- The system then evaluates whether the results of both tests meet predefined conditions.
- If the conditions are satisfied, an action is executed.
Potential Applications: - This technology can be applied in memory systems to optimize performance based on temperature variations. - It can be used in data centers to enhance memory block efficiency and reliability.
Problems Solved: - Helps in identifying and addressing potential issues related to wordline leakage in memory blocks. - Enables proactive maintenance based on temperature conditions to prevent memory failures.
Benefits: - Improved memory system reliability and performance. - Enhanced temperature-based management for memory blocks. - Cost-effective maintenance strategies for memory systems.
Commercial Applications: Title: Temperature-Responsive Memory Sub-System for Enhanced Performance This technology can be utilized in various commercial applications such as: - Data centers - Cloud computing facilities - High-performance computing systems
Questions about the technology: 1. How does the memory sub-system determine the temperature of the memory block?
The temperature is typically measured using sensors integrated into the memory block or the surrounding environment.
2. What specific actions are triggered when the test conditions are met?
The abstract does not specify the exact actions, but they could include adjusting memory settings or notifying system administrators.
Original Abstract Submitted
A memory sub-system causing execution of a first wordline leakage test of a first wordline group of a set of wordline groups of a memory block in response to determining a temperature of the memory block is within a threshold temperature range. A first result of the first wordline leakage test is determined. A second wordline leakage test of a second wordline group is caused to be executed and a second result is determined. A determination is made that the first result of the first wordline leakage test of the first wordline group satisfies a first condition. A determination is made that the second result of the second wordline leakage test of the second wordline group satisfies a second condition. In response to satisfaction of the conditions, an action is executed.
