18706217. COMPONENT INSPECTION METHOD AND COMPONENT INSPECTION DEVICE (FUJI CORPORATION)
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COMPONENT INSPECTION METHOD AND COMPONENT INSPECTION DEVICE
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COMPONENT INSPECTION METHOD AND COMPONENT INSPECTION DEVICE
This abstract first appeared for US patent application 18706217 titled 'COMPONENT INSPECTION METHOD AND COMPONENT INSPECTION DEVICE
Original Abstract Submitted
A component inspection method according to the present disclosure includes imaging an upper surface of a board on which a component is mounted to acquire a color image in which a color of each pixel is represented by luminance values of multiple primary colors, extracting a pixel having a luminance value in a predetermined range corresponding to the color of the component among pixels constituting the color image as a specific pixel, performing emphasis processing of emphasizing the luminance value of the extracted specific pixel, and determining whether the component is mounted at a correct position by performing edge detection on the color image subjected to the emphasis processing.
