18678322. BEAM INDICATION FOR FULL DUPLEX (SAMSUNG ELECTRONICS CO., LTD.)

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BEAM INDICATION FOR FULL DUPLEX

Organization Name

SAMSUNG ELECTRONICS CO., LTD.

Inventor(s)

Emad Nader Farag of Flanders NJ (US)

Marian Rudolf of Longueuil (CA)

Eko Onggosanusi of Coppell TX (US)

Dalin Zhu of Allen TX (US)

Aristides Papasakellariou of Houston TX (US)

BEAM INDICATION FOR FULL DUPLEX

This abstract first appeared for US patent application 18678322 titled 'BEAM INDICATION FOR FULL DUPLEX



Original Abstract Submitted

Methods and apparatuses for beam indication for full duplex. A method of operating a user equipment (UE) includes receiving first and second information that includes first and second transmission configuration indicator (TCI) state configurations associated with first and second subsets of slots or symbols, respectively, on a cell and receiving a downlink control information (DCI) format that includes a first or second TCI state code point from the first or second TCI state configuration. The method further includes determining, based on whether a slot or symbol is from the first or second subset, the first or second TCI state code point and receiving, based on the determination, a shared data or control channel or signal using the first or second TCI state code point. The first subset does not include time-domain resources indicated for simultaneous transmission and reception on the cell and the second subset does.