18666177. PARTICLES FOR SPECIMEN EXAMINATIONS simplified abstract (CANON KABUSHIKI KAISHA)
Contents
PARTICLES FOR SPECIMEN EXAMINATIONS
Organization Name
Inventor(s)
TEIGO Sakakibara of Tokyo (JP)
NORISHIGE Kakegawa of Tokyo (JP)
FUMIO Yamauchi of Kanagawa (JP)
KENGO Kanazaki of Kanagawa (JP)
TAKAHIRO Masumura of Tochigi (JP)
TOMOHIRO Nakamura of Saitama (JP)
PARTICLES FOR SPECIMEN EXAMINATIONS - A simplified explanation of the abstract
This abstract first appeared for US patent application 18666177 titled 'PARTICLES FOR SPECIMEN EXAMINATIONS
Simplified Explanation: The patent application describes a particle that enhances the sensitivity of specimen testing through a fluorescence depolarization method. The particle includes a polymer with styrene and organic silane units, as well as a europium complex, and features a siloxane bond on its surface.
- The particle enables high-sensitivity specimen testing.
- Contains a polymer with styrene and organic silane units.
- Includes a europium complex for fluorescence depolarization.
- Features a siloxane bond on the particle substrate surface.
Potential Applications: 1. Medical diagnostics for detecting specific biomarkers. 2. Environmental testing for pollutants or contaminants. 3. Pharmaceutical research for drug development. 4. Forensic analysis for crime scene investigations.
Problems Solved: 1. Enhances the sensitivity of specimen testing. 2. Improves accuracy in detecting target substances. 3. Facilitates rapid and efficient analysis of samples.
Benefits: 1. Increased sensitivity in specimen testing. 2. Enhanced accuracy in detecting specific substances. 3. Streamlined analysis process for faster results.
Commercial Applications: Potential commercial applications include:
- Biotechnology companies for research and development.
- Clinical laboratories for medical diagnostics.
- Environmental agencies for pollution monitoring.
Questions about Particle for High-Sensitivity Specimen Testing: 1. How does the particle substrate contribute to the sensitivity of specimen testing? 2. What are the key advantages of using a fluorescence depolarization method for analysis?
Original Abstract Submitted
Provided are a particle that enables a high-sensitivity specimen test by a fluorescence depolarization method, and a method of producing the same. Specifically, provided is a particle including a particle substrate, wherein the particle substrate includes: a polymer containing a styrene unit and an organic silane unit; and a europium complex, and wherein the particle substrate contains a siloxane bond on at least a surface of the particle substrate.
