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18665884. STORAGE DEVICE AND CONTROL METHOD THEREOF (SAMSUNG ELECTRONICS CO., LTD.)

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STORAGE DEVICE AND CONTROL METHOD THEREOF

Organization Name

SAMSUNG ELECTRONICS CO., LTD.

Inventor(s)

Kwangjin Lee of Suwon-si KR

Kirock Kwon of Suwon-si KR

STORAGE DEVICE AND CONTROL METHOD THEREOF

This abstract first appeared for US patent application 18665884 titled 'STORAGE DEVICE AND CONTROL METHOD THEREOF

Original Abstract Submitted

A storage device includes a memory device including a plurality of memory blocks, a temperature sensor measuring an internal temperature of the storage device, and a controller, wherein the temperature sensor measures a program temperature at a point in time of programming data in the plurality of memory blocks, and the controller stores the program temperature of program memory blocks, wherein the controller determines at least one memory block failed to read the data programmed in the plurality of memory blocks, when the program temperature of the error block and a read attempt temperature fall within a driving guarantee temperature range, and the controller is configured to calculate a difference in temperature between the program temperature of the error block and the read attempt temperature, compares the difference in temperature and a guarantee magnitude, to register the error block as a bad block or a refresh candidate block.