18654028. SiC SEMICONDUCTOR DEVICE simplified abstract (ROHM CO., LTD.)

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SiC SEMICONDUCTOR DEVICE

Organization Name

ROHM CO., LTD.

Inventor(s)

Masaya Ueno of Kyoto-shi (JP)

Yuki Nakano of Kyoto-shi (JP)

Sawa Haruyama of Kyoto-shi (JP)

Yasuhiro Kawakami of Kyoto-shi (JP)

Seiya Nakazawa of Kyoto-shi (JP)

Yasunori Kutsuma of Kyoto-shi (JP)

SiC SEMICONDUCTOR DEVICE - A simplified explanation of the abstract

This abstract first appeared for US patent application 18654028 titled 'SiC SEMICONDUCTOR DEVICE

The abstract describes a patent application for an SiC semiconductor device with a unique structure.

  • SiC semiconductor layer with a first main surface as an element forming surface and a second main surface on the opposite side.
  • Plurality of side surfaces connecting the first and second main surfaces.
  • Modified lines formed on the side surfaces, each extending in a band shape along a tangential direction to the first main surface.
  • Modified lines have properties different from the SiC monocrystal.

Potential Applications: - High-power electronic devices - High-temperature applications - Aerospace and defense industries

Problems Solved: - Improved performance and efficiency of SiC semiconductor devices - Enhanced thermal management capabilities - Increased reliability in harsh environments

Benefits: - Higher power handling capabilities - Improved thermal conductivity - Extended device lifespan

Commercial Applications: Title: "Advanced SiC Semiconductor Devices for High-Power Applications" This technology can be utilized in industries requiring high-power electronic devices, such as electric vehicles, renewable energy systems, and industrial equipment.

Questions about SiC Semiconductor Devices: 1. How does the modified line structure on the SiC semiconductor layer improve device performance?

  - The modified lines enhance thermal management and overall efficiency of the device.

2. What sets SiC semiconductor devices apart from traditional silicon-based devices?

  - SiC devices offer higher power handling capabilities and better performance in high-temperature environments.


Original Abstract Submitted

An SiC semiconductor device includes an SiC semiconductor layer including an SiC monocrystal and having a first main surface as an element forming surface, a second main surface at a side opposite to the first main surface, and a plurality of side surfaces connecting the first main surface and the second main surface, and a plurality of modified lines formed one layer each at the respective side surfaces of the SiC semiconductor layer and each extending in a band shape along a tangential direction to the first main surface of the SiC semiconductor layer and modified to be of a property differing from the SiC monocrystal.