18639944. INSPECTION TOOL AND INSPECTION METHOD simplified abstract (FUJIFILM Corporation)
Contents
INSPECTION TOOL AND INSPECTION METHOD
Organization Name
Inventor(s)
INSPECTION TOOL AND INSPECTION METHOD - A simplified explanation of the abstract
This abstract first appeared for US patent application 18639944 titled 'INSPECTION TOOL AND INSPECTION METHOD
The present invention offers an inspection tool and method to distinguish whether light irradiation with wavelengths of 222 nm and 254 nm has occurred even in sunlight.
- Sensing portion includes a layer that detects light in the range of 200 to 254 nm.
- Reference portion consists of the sensing layer and a transparent layer meeting specific criteria.
Key Features and Innovation:
- Ability to differentiate light irradiation with specific wavelengths under sunlight.
- Sensing layer detects light in the 200-254 nm range.
- Transparent layer in the reference portion satisfies specific conditions.
Potential Applications:
- UV light detection in various environments.
- Monitoring light exposure in medical or research settings.
- Ensuring proper UV disinfection procedures.
Problems Solved:
- Difficulty in discerning specific light wavelengths in the presence of sunlight.
- Ensuring accurate UV light exposure measurements.
Benefits:
- Enhanced accuracy in detecting specific light wavelengths.
- Improved monitoring of UV light exposure.
- Facilitates precise UV disinfection processes.
Commercial Applications: UV light detection tools for medical facilities, research labs, and industrial settings.
Questions about UV Light Inspection Tool: 1. How does the inspection tool differentiate between different light wavelengths? 2. What are the specific criteria for the transparent layer in the reference portion?
Frequently Updated Research: Stay updated on advancements in UV light detection technology for potential improvements in accuracy and efficiency.
Original Abstract Submitted
The present invention provides an inspection tool and an inspection method, with which it is possible to easily discriminate whether or not irradiation with light having a wavelength of 222 nm and light having a wavelength of 254 nm is performed even under sunlight. The inspection tool of the present invention includes a sensing portion and a reference portion, in which the sensing portion includes a sensing layer which senses at least light having a wavelength of 200 to 254 nm, the reference portion includes the sensing layer and a transparent layer, and the transparent layer satisfies a relationship of Expressions (1) and (2),
