18625903. INLINE DATA INSPECTION FOR WORKLOAD SIMPLIFICATION simplified abstract (NVIDIA Corporation)
Contents
INLINE DATA INSPECTION FOR WORKLOAD SIMPLIFICATION
Organization Name
Inventor(s)
Jeffrey Michael Pool of Durham NC (US)
Andrew Kerr of San Francisco CA (US)
Ming Y. Siu of Santa Clara CA (US)
Stuart Oberman of Sunnyvale CA (US)
INLINE DATA INSPECTION FOR WORKLOAD SIMPLIFICATION - A simplified explanation of the abstract
This abstract first appeared for US patent application 18625903 titled 'INLINE DATA INSPECTION FOR WORKLOAD SIMPLIFICATION
Simplified Explanation: The patent application describes a method, computer readable medium, and processor for inline data inspection using a decoder to decode a load instruction, which includes a signal to indicate whether the loaded data exceeds a threshold value.
- Inline data inspection method using a decoder
- Signal to indicate if loaded data exceeds a threshold value
- Circuit in a processor to show data loaded by a load instruction
- Storage of indication if loaded data exceeds a threshold value
Key Features and Innovation:
- Use of a decoder for inline data inspection
- Signal to indicate threshold value exceedance
- Integration with processor circuit for real-time data analysis
- Storage capability for threshold value exceedance indication
Potential Applications:
- Real-time data monitoring in processors
- Quality control in manufacturing processes
- Security applications for detecting anomalies in data loads
Problems Solved:
- Efficient data inspection in real-time
- Quick identification of data exceeding threshold values
- Enhanced security measures for data processing
Benefits:
- Improved data analysis accuracy
- Timely detection of abnormal data loads
- Enhanced system security and performance
Commercial Applications:
- Data processing industries
- Manufacturing and production sectors
- Cybersecurity companies
Questions about Inline Data Inspection: 1. How does the decoder help in inline data inspection? 2. What are the potential benefits of real-time data monitoring in processors?
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Original Abstract Submitted
A method, computer readable medium, and processor are described herein for inline data inspection by using a decoder to decode a load instruction, including a signal to cause a circuit in a processor to indicate whether data loaded by a load instruction exceeds a threshold value. Moreover, an indication of whether data loaded by a load instruction exceeds a threshold value may be stored.
