18600289. PARTICLE BEAM MICROSCOPE simplified abstract (Carl Zeiss Microscopy GmbH)
Contents
PARTICLE BEAM MICROSCOPE
Organization Name
Inventor(s)
PARTICLE BEAM MICROSCOPE - A simplified explanation of the abstract
This abstract first appeared for US patent application 18600289 titled 'PARTICLE BEAM MICROSCOPE
Simplified Explanation:
The patent application describes a particle beam microscope that utilizes two scintillators to generate light with different spectral distributions, which overlap to enhance imaging capabilities.
- The particle beam microscope includes a particle beam source, an objective lens, a first scintillator, a second scintillator, and a light detector.
- The first scintillator generates light with a first spectral distribution, while the second scintillator generates light with a different second spectral distribution.
- The overlapping beam paths of light from the two scintillators improve the imaging quality of the microscope.
Key Features and Innovation:
- Utilization of two scintillators with different spectral distributions.
- Overlapping beam paths of light for enhanced imaging capabilities.
- Improved imaging quality in a particle beam microscope.
Potential Applications:
- Material analysis in research laboratories.
- Biological imaging in medical research.
- Semiconductor inspection in manufacturing processes.
Problems Solved:
- Enhanced imaging resolution.
- Improved contrast in microscopic images.
- Better differentiation of materials or structures.
Benefits:
- Higher quality imaging results.
- Increased accuracy in material analysis.
- Enhanced visualization of microscopic details.
Commercial Applications:
Particle Beam Microscope Technology for Advanced Material Analysis and Biological Imaging
Questions about Particle Beam Microscope Technology:
1. How does the use of two scintillators with different spectral distributions improve imaging quality in a particle beam microscope? 2. What are the potential commercial applications of this technology in various industries?
Original Abstract Submitted
A particle beam microscope comprises a particle beam source, an objective lens, a first scintillator, a second scintillator, and a light detector. A first beam path of light generated by the first scintillator and a second beam path of light generated by the second scintillator overlap one another. A scintillator body of the first scintillator generates light having a first spectral distribution. The second scintillator generates light having a second spectral distribution, which is different from the first spectral distribution.
