18600212. ELECTRON BEAM MICROSCOPE simplified abstract (Carl Zeiss Microscopy GmbH)
Contents
ELECTRON BEAM MICROSCOPE
Organization Name
Inventor(s)
ELECTRON BEAM MICROSCOPE - A simplified explanation of the abstract
This abstract first appeared for US patent application 18600212 titled 'ELECTRON BEAM MICROSCOPE
The abstract describes an electron beam microscope with various components such as an electron beam source, a beam tube, a magnetic objective lens, an object holder, a scintillator arrangement, a detector arrangement, and a potential supply system.
- The power supply system provides different potentials to various components of the microscope:
* The object holder is supplied with a potential U1. * The beam tube is supplied with a potential U2. * The pole end of the objective lens is supplied with a potential U3. * The scintillator body of the scintillator arrangement is supplied with a potential. * The light detector of the detector arrangement is supplied with a potential U5.
- The electron beam microscope utilizes these potentials to function effectively and produce high-quality images for analysis and research purposes.
- The precise control of potentials to different components allows for accurate imaging and analysis of samples at the microscopic level.
- This innovation in potential supply systems enhances the performance and capabilities of electron beam microscopes in various scientific and industrial applications.
- The integration of the potential supply system with other components of the microscope ensures optimal functionality and image quality.
Potential Applications: The electron beam microscope with an advanced potential supply system can be used in various fields such as materials science, biology, nanotechnology, and semiconductor research.
Problems Solved: The precise control of potentials to different components addresses issues related to image quality, resolution, and accuracy in electron beam microscopy.
Benefits: Enhanced imaging capabilities, improved resolution, accurate analysis of samples, and increased efficiency in research and analysis processes.
Commercial Applications: The advanced potential supply system in electron beam microscopes can be utilized in research institutions, universities, semiconductor industries, and medical laboratories for various imaging and analysis purposes.
Questions about Electron Beam Microscopes: 1. How does the potential supply system impact the image quality in electron beam microscopes?
The potential supply system plays a crucial role in controlling the potentials of different components, leading to improved image quality and resolution.
2. What are the key advantages of using an electron beam microscope with an advanced potential supply system?
The benefits include enhanced imaging capabilities, accurate analysis of samples, and increased efficiency in research processes.
Original Abstract Submitted
An electron beam microscope comprises an electron beam source, a beam tube, a magnetic objective lens, an object holder, a scintillator arrangement, a detector arrangement and a potential supply system. The power supply system supplies: i) the object holder with a potential U1; ii) the beam tube with a potential U2; iii) a pole end of the objective lens with a potential U3; iv) a scintillator body of the scintillator arrangement with a potential; and v) a light detector of the detector arrangement with a potential U5, such that:
