18588599. SEMICONDUCTOR MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
Contents
- 1 SEMICONDUCTOR MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 SEMICONDUCTOR MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Key Features and Innovation
- 1.6 Potential Applications
- 1.7 Problems Solved
- 1.8 Benefits
- 1.9 Commercial Applications
- 1.10 Questions about the Technology
- 1.11 Original Abstract Submitted
SEMICONDUCTOR MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME
Organization Name
Inventor(s)
Sunghye Cho of Hwaseong-si (KR)
SEMICONDUCTOR MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME - A simplified explanation of the abstract
This abstract first appeared for US patent application 18588599 titled 'SEMICONDUCTOR MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME
Simplified Explanation
The semiconductor memory device described in the patent application includes a memory cell array and a cyclic redundancy check (CRC) engine. The CRC engine detects errors in data provided from a memory controller external to the device and transmits error flags accordingly.
- The memory cell array consists of volatile memory cells connected to word-lines and bit-lines.
- The CRC engine identifies errors in main data and system parity data during memory operations.
- It distinguishes between errors related to the external link and those associated with the volatile memory cells.
- Error flags are generated and sent back to the memory controller for further action.
Key Features and Innovation
- Integration of a CRC engine in a semiconductor memory device.
- Detection and differentiation of errors in main data and system parity data.
- Real-time error flag generation for efficient error handling.
- Improved data integrity and reliability in memory operations.
- Enhanced communication between the memory device and external controllers.
Potential Applications
- Data storage systems
- Embedded systems
- Communication devices
- Automotive electronics
- Industrial control systems
Problems Solved
- Error detection and correction in memory operations.
- Ensuring data integrity in volatile memory cells.
- Efficient communication between memory devices and external controllers.
Benefits
- Enhanced reliability of data storage.
- Improved system performance.
- Reduced risk of data corruption.
- Simplified error handling processes.
- Increased overall system efficiency.
Commercial Applications
The technology described in this patent application could find applications in various industries such as data storage, embedded systems, communication devices, automotive electronics, and industrial control systems. By improving error detection and correction processes in memory operations, it can enhance data integrity, system performance, and overall efficiency in these sectors.
Questions about the Technology
How does the CRC engine in the semiconductor memory device improve error detection and correction processes?
The CRC engine in the semiconductor memory device enhances error detection and correction processes by analyzing main data and system parity data during memory operations. It can differentiate between errors related to the external link and those associated with the volatile memory cells, allowing for efficient error handling and improved data integrity.
What are the potential applications of this technology in different industries?
The technology described in the patent application has potential applications in various industries such as data storage, embedded systems, communication devices, automotive electronics, and industrial control systems. By enhancing error detection and correction processes in memory operations, it can improve data integrity, system performance, and overall efficiency in these sectors.
Original Abstract Submitted
A semiconductor memory device includes a memory cell array and a cyclic redundancy check (CRC) engine. The memory cell array includes a plurality of volatile memory cells coupled to respective ones of a plurality of word-lines and respective ones of a plurality of bit-lines. The CRC engine, during a memory operation on the memory cell array, detects an error in a main data and a system parity data provided from a memory controller external to the semiconductor memory device through a link, generates an error flag indicating whether the detected error corresponds to either a first type of error associated with the link or a second type of error associated with the volatile memory cells based on the system parity data and transmit the error flag to the memory controller.
