18587812. MEASUREMENT METHOD, APPARATUS, AND SYSTEM simplified abstract (Huawei Technologies Co., Ltd.)
Contents
MEASUREMENT METHOD, APPARATUS, AND SYSTEM
Organization Name
Inventor(s)
MEASUREMENT METHOD, APPARATUS, AND SYSTEM - A simplified explanation of the abstract
This abstract first appeared for US patent application 18587812 titled 'MEASUREMENT METHOD, APPARATUS, AND SYSTEM
The abstract describes a method, apparatus, and system for optimizing layer 1 measurements when overlapping with layer 3 measurements, reducing delays.
- Simplified Explanation:
This technology improves the efficiency of layer 1 measurements in the presence of layer 3 measurements, reducing delays.
- Key Features and Innovation:
- Method to prioritize layer 1 measurements over layer 3 measurements when overlapping - Apparatus for implementing the measurement method - System for coordinating and managing layer 1 and layer 3 measurements
- Potential Applications:
- Telecommunications networks - Mobile devices - Internet of Things (IoT) devices
- Problems Solved:
- Minimizing delays in layer 1 measurements - Optimizing resource allocation for measurements - Enhancing overall network performance
- Benefits:
- Improved accuracy of layer 1 measurements - Reduced interference between layer 1 and layer 3 measurements - Enhanced network efficiency and performance
- Commercial Applications:
Optimizing network performance in telecommunications, mobile devices, and IoT applications can lead to improved user experience and operational efficiency.
- Questions about the Technology:
1. How does this technology impact the overall performance of telecommunications networks? 2. What are the potential challenges in implementing this method in mobile devices?
- Frequently Updated Research:
Stay updated on advancements in network measurement techniques and resource optimization strategies to enhance the effectiveness of this technology.
Original Abstract Submitted
Embodiments of this application provide a measurement method, an apparatus, and a system, so that when a time domain resource for layer 1 measurement and a configured time domain resource for layer 3 measurement overlap, the layer 1 measurement can be preferentially performed, thereby reducing a layer 1 measurement delay. The method includes: A terminal device obtains a first parameter associated with a first portion of a first time resource for a layer 1 measurement to a second time domain resource for a layer 3 measurement, determines first duration based on the first parameter perform the layer 1 measurement.
