18584385. MEMORY DIE FAULT DETECTION USING A CALIBRATION PIN simplified abstract (Micron Technology, Inc.)
Contents
MEMORY DIE FAULT DETECTION USING A CALIBRATION PIN
Organization Name
Inventor(s)
Scott E. Schaefer of Boise ID (US)
Paul A. Laberge of Shoreview MN (US)
MEMORY DIE FAULT DETECTION USING A CALIBRATION PIN - A simplified explanation of the abstract
This abstract first appeared for US patent application 18584385 titled 'MEMORY DIE FAULT DETECTION USING A CALIBRATION PIN
Simplified Explanation: This patent application describes methods, systems, and devices for detecting faults in memory dies using a calibration pin. The memory device can identify fault conditions in memory dies by coupling the pin to a second resistor based on commands from a host device.
- Memory device performs calibration on memory dies using a calibration pin
- Pin is coupled to a second resistor to identify fault conditions in memory dies
- Host device commands the memory device to read registers of memory dies
- Memory device outputs an indication of the faulty memory die to the host device
- Fault detection process is facilitated by the calibration pin
Key Features and Innovation: - Utilization of a calibration pin for fault detection in memory dies - Coupling the pin to a second resistor based on fault conditions identified by memory dies - Host device commands facilitate the fault detection process - Outputting indications of faulty memory dies to the host device
Potential Applications: - Memory module testing and quality control - Fault detection in memory devices - Improving reliability and performance of memory modules
Problems Solved: - Efficient fault detection in memory dies - Enhancing the reliability of memory modules - Streamlining the calibration process for memory devices
Benefits: - Improved fault detection accuracy - Enhanced reliability of memory modules - Streamlined calibration procedures
Commercial Applications: Title: Memory Die Fault Detection System for Enhanced Reliability This technology can be utilized in the semiconductor industry for memory module testing, quality control, and fault detection processes. It can benefit manufacturers looking to improve the reliability and performance of memory devices, ultimately leading to higher customer satisfaction and reduced returns.
Prior Art: There may be prior art related to fault detection systems in memory devices using calibration pins or similar methods. Researchers can explore patents and publications in the field of semiconductor testing and memory module quality control for relevant information.
Frequently Updated Research: Researchers in the field of semiconductor testing and memory device reliability may conduct studies on fault detection methods using calibration pins. Stay updated on industry publications and conferences for the latest advancements in memory module quality control.
Questions about Memory Die Fault Detection using Calibration Pin: 1. How does the calibration pin facilitate fault detection in memory dies? 2. What are the potential applications of this technology in the semiconductor industry?
Original Abstract Submitted
Methods, systems, and devices for memory die fault detection using a calibration pin are described. A memory device may perform a calibration procedure on a first resistor of each of a set of memory dies of a memory module using a pin coupled with the memory module. The memory device may couple the pin to a second resistor of a memory die of the set of memory dies based on the memory die identifying a fault condition for the memory die executing one or more of multiple commands from the host device. The memory device may receive, from the host device, a command to read a register of one or more memory dies of the set of memory dies and may output, to the host device, an indication of the memory die that identified the fault condition based on coupling the pin to the second resistor.
