18574653. INSPECTION SYSTEM AND INSPECTION METHOD simplified abstract (TSINGHUA UNIVERSITY)

From WikiPatents
Jump to navigation Jump to search

INSPECTION SYSTEM AND INSPECTION METHOD

Organization Name

TSINGHUA UNIVERSITY

Inventor(s)

Li Zhang of Beijing (CN)

Zhiqiang Chen of Beijing (CN)

Qingping Huang of Beijing (CN)

Hui Ding of Beijing (CN)

Yong Zhou of Beijing (CN)

Xin Jin of Beijing (CN)

Liming Yao of Beijing (CN)

INSPECTION SYSTEM AND INSPECTION METHOD - A simplified explanation of the abstract

This abstract first appeared for US patent application 18574653 titled 'INSPECTION SYSTEM AND INSPECTION METHOD

The inspection system and method described in the abstract involve a carrying device, at least one ray source, and a detector assembly.

  • The ray source is housed in a separate housing that defines a vacuum space and target spots enclosed within.
  • The ray source can rotate between scanning positions around a rotation axis relative to the carrying device.
  • The ray source and detector assembly can be lifted or lowered along the rotation axis.
  • X-rays are emitted when the ray source is in a scanning position, and after moving a predetermined distance, the ray source rotates to another scanning position.

Potential Applications:

  • Industrial inspection of materials for defects or foreign objects.
  • Medical imaging for diagnostic purposes.
  • Security screening at airports or other high-security locations.

Problems Solved:

  • Efficient and precise inspection of objects.
  • Versatile system that can be used in various industries.
  • Provides detailed imaging for analysis and decision-making.

Benefits:

  • Increased accuracy in detecting abnormalities.
  • Quick and reliable inspection process.
  • Flexibility in adjusting the system for different applications.

Commercial Applications:

  • Quality control in manufacturing processes.
  • Medical imaging equipment for hospitals and clinics.
  • Security systems for public spaces.

Questions about the inspection system: 1. How does the rotation of the ray source improve the inspection process? 

  - The rotation allows for comprehensive scanning of the object from multiple angles, enhancing the quality of the inspection results.

2. What are the advantages of having a separate housing for the ray source? 

  - The separate housing helps maintain a vacuum space, ensuring the accuracy of the inspection by minimizing interference from external factors.


Original Abstract Submitted

Provided are an inspection system and an inspection method, the inspection system includes: a carrying device (); at least one ray source () each includes a separate housing () to define a vacuum space and target spots enclosed within the housing (), and a detector assembly (). The at least one ray source () is rotatable between a plurality of scanning positions around a rotation axis relative to the carrying device (). The at least one ray source () and the detector assembly () may be lifted or lowered along the rotation axis relative to the carrying device (). When the at least one ray source () is located at one of scanning positions relative to the carrying device (), the at least one ray source () and the detector assembly () are lifted or lowered along the rotation axis relative to the carrying device () and the at least one ray source () emits X-rays. After the at least one ray source () and the detector assembly () are lifted or lowered a predetermined distance relative to the carrying device (), the at least one ray source () rotates around the rotation axis relative to the carrying device () to another one of scanning positions.

Retrieved from "http://wikipatents.org/index.php?title=18574653._INSPECTION_SYSTEM_AND_INSPECTION_METHOD_simplified_abstract_(TSINGHUA_UNIVERSITY)&oldid=89300"