18566795. LEARNING METHOD simplified abstract (NEC Corporation)

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LEARNING METHOD

Organization Name

NEC Corporation

Inventor(s)

Yuji Kobayashi of Tokyo (JP)

Yoshiaki Sakae of Tokyo (JP)

Hiroki Tagato of Tokyo (JP)

Takashi Konashi of Tokyo (JP)

Jun Nishioka of Tokyo (JP)

Jun Kodama of Tokyo (JP)

Etsuko Ichihara of Tokyo (JP)

LEARNING METHOD - A simplified explanation of the abstract

This abstract first appeared for US patent application 18566795 titled 'LEARNING METHOD

Simplified Explanation:

This patent application describes a learning device that classifies measurement value data based on situation data, selects the data for each classification, and performs machine learning on the selected data.

  • The learning device includes a classification unit for categorizing measurement value data based on situation data.
  • A selection unit is used to choose the measurement value data for each classification based on the number of data points available.
  • A learning unit conducts machine learning using the selected measurement value data.

Key Features and Innovation:

  • Classification unit for organizing measurement value data.
  • Selection unit for choosing data based on availability.
  • Learning unit for machine learning on selected data.

Potential Applications:

This technology could be applied in various fields such as healthcare, finance, and manufacturing for performance analysis and optimization.

Problems Solved:

This technology helps in efficiently analyzing and learning from measurement value data in different situations.

Benefits:

  • Improved performance analysis.
  • Enhanced decision-making based on data.
  • Optimized object performance.

Commercial Applications:

Title: "Advanced Learning Device for Performance Analysis and Optimization"

This technology can be utilized in industries such as healthcare for patient monitoring, finance for market analysis, and manufacturing for quality control.

Prior Art:

Readers can explore prior research on machine learning algorithms for performance analysis and classification of data.

Frequently Updated Research:

Stay updated on advancements in machine learning algorithms and data classification techniques for performance analysis.

Questions about Learning Devices: 1. How can learning devices benefit different industries? 2. What are the key components of a learning device and how do they work together?


Original Abstract Submitted

A learning device according to this invention includes: a classification unit configured to classify measurement value data measuring performance of an object on the basis of situation data each representing a situation of the object when the measurement value data are measured; a selection unit configured to select the measurement value data from each of the classifications according to the number of the measurement value data for each of the classifications; and a learning unit configured to perform machine learning on the basis of the selected measurement value data.