18556158. METHOD FOR DETERMINING WEAR IN AN ELECTRONIC UNIT, AND TEST APPARATUS simplified abstract (Robert Bosch GmbH)
Contents
METHOD FOR DETERMINING WEAR IN AN ELECTRONIC UNIT, AND TEST APPARATUS
Organization Name
Inventor(s)
Andreas Schmidtlein of Tamm (DE)
Simeon Lange of Mundelsheim (DE)
METHOD FOR DETERMINING WEAR IN AN ELECTRONIC UNIT, AND TEST APPARATUS - A simplified explanation of the abstract
This abstract first appeared for US patent application 18556158 titled 'METHOD FOR DETERMINING WEAR IN AN ELECTRONIC UNIT, AND TEST APPARATUS
Simplified Explanation: This patent application describes a method for determining wear in an electronic unit, such as a power electronics unit, by subjecting the unit to specific electrical load cycles and detecting electromagnetic waves generated by the unit during the test procedure.
- The method involves applying at least two predefinable electrical load cycles to the unit to simulate different operating modes.
- Electromagnetic waves generated by the unit due to the applied load cycles are detected and compared to detect wear in the unit, particularly in electronic components like semiconductors or capacitors.
Key Features and Innovation:
- Method for determining wear in electronic units through specific electrical load cycles.
- Detection of electromagnetic waves to assess wear in electronic components.
- Simulation of different operating modes to evaluate the unit's performance.
Potential Applications:
- Quality control in manufacturing electronic units.
- Predictive maintenance in power electronics systems.
- Performance optimization in electronic components.
Problems Solved:
- Efficient method for detecting wear in electronic units.
- Early identification of potential failures in electronic components.
- Improved reliability and longevity of electronic systems.
Benefits:
- Cost-effective maintenance strategies.
- Enhanced performance and durability of electronic units.
- Minimized downtime due to unexpected failures.
Commercial Applications:
- Predictive maintenance services for power electronics industries.
- Quality control solutions for electronic manufacturing companies.
- Research and development in electronic component testing.
Prior Art:
- Prior research on electromagnetic interference testing in electronic systems.
- Studies on accelerated aging tests for electronic components.
Frequently Updated Research:
- Ongoing studies on wear detection techniques in power electronics.
- Latest advancements in predictive maintenance technologies for electronic systems.
Questions about Wear Detection in Electronic Units: 1. How does the method of detecting wear through electromagnetic waves compare to traditional diagnostic techniques? 2. What are the potential limitations of this wear detection method in different electronic components?
Original Abstract Submitted
A method for determining wear in an electronic unit, in particular a power electronics unit, which includes at least one electronic component, in particular a semiconductor component, capacitor or the like. The unit is subjected to a test procedure in which at least two predefinable electrical load cycles are applied to the unit, in which cycles the unit is operated in each case in order to simulate at least one selected operating mode for a predefined period of time. During the test procedure, electromagnetic waves generated by the unit by an electrical load resulting from the application of the at least two load cycles to the unit are detected for at least two of the load cycles, and the detected electromagnetic waves of the at least two load cycles are compared with one another in order to detect wear in the unit.
