18546928. BEAM FAILURE DETECTION IN FULL-DUPLEX OPERATION simplified abstract (QUALCOMM Incorporated)
Contents
- 1 BEAM FAILURE DETECTION IN FULL-DUPLEX OPERATION
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 BEAM FAILURE DETECTION IN FULL-DUPLEX OPERATION - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 How does this technology impact battery life in user equipment (UE)?
- 1.11 What are the specific technical requirements for implementing this technology in existing wireless communication systems?
- 1.12 Original Abstract Submitted
BEAM FAILURE DETECTION IN FULL-DUPLEX OPERATION
Organization Name
Inventor(s)
Muhammad Sayed Khairy Abdelghaffar of San Jose CA (US)
Linhai He of San Diego CA (US)
Abdelrahman Mohamed Ahmed Mohamed Ibrahim of San Diego CA (US)
Ahmed Attia Abotabl of San Diego CA (US)
Krishna Kiran Mukkavilli of San Diego CA (US)
Hwan Joon Kwon of San Diego CA (US)
BEAM FAILURE DETECTION IN FULL-DUPLEX OPERATION - A simplified explanation of the abstract
This abstract first appeared for US patent application 18546928 titled 'BEAM FAILURE DETECTION IN FULL-DUPLEX OPERATION
Simplified Explanation
Various aspects of the present disclosure generally relate to wireless communication. In some aspects, a user equipment (UE) may receive, from a base station, a beam failure detection (BED) reference signal set in one or more slots in a full-duplex mode and in one or more slots in a half-duplex mode. The UE may detect beam failure due to self-interference based at least in part on a comparison of measurements of the BFD reference signal set in the full-duplex mode and half-duplex mode. The UE may switch from the full-duplex mode to the half-duplex mode for slots configured for the full-duplex mode based at least in part on detecting beam failure due to self-interference. Numerous other aspects are described.
- User equipment (UE) can receive a beam failure detection (BED) reference signal set from a base station in full-duplex and half-duplex modes.
- The UE can detect beam failure due to self-interference by comparing measurements in both modes.
- The UE can switch from full-duplex to half-duplex mode for affected slots upon detecting beam failure.
Potential Applications
This technology could be applied in:
- Wireless communication systems
- Mobile networks
- Internet of Things (IoT) devices
Problems Solved
- Self-interference detection in wireless communication
- Improving signal reliability in full-duplex mode
Benefits
- Enhanced communication reliability
- Efficient use of spectrum resources
Potential Commercial Applications
Optimized for:
- 5G networks
- IoT devices
- Smart city infrastructure
Possible Prior Art
No known prior art at this time.
Unanswered Questions
How does this technology impact battery life in user equipment (UE)?
The abstract does not mention the potential impact on battery life in UE. This could be a crucial factor for mobile devices and IoT devices that rely on battery power.
What are the specific technical requirements for implementing this technology in existing wireless communication systems?
The abstract does not provide details on the technical specifications or compatibility requirements for integrating this technology into current wireless communication infrastructure. Understanding these requirements would be essential for deployment and adoption.
Original Abstract Submitted
Various aspects of the present disclosure generally relate to wireless communication. In some aspects, a user equipment (UE) may receive, from a base station, a beam failure detection (BED) reference signal set in one or more slots in a full-duplex mode and in one or more slots in a half-duplex mode. The UE may detect beam failure due to self-interference based at least in part on a comparison of measurements of the BFD reference signal set in the full-duplex mode and half-duplex mode. The UE may switch from the full-duplex mode to the half-duplex mode for slots configured for the full-duplex mode based at least in part on detecting beam failure due to self-interference. Numerous other aspects are described.
- QUALCOMM Incorporated
- Ruiming Zheng of Beijing (CN)
- Muhammad Sayed Khairy Abdelghaffar of San Jose CA (US)
- Linhai He of San Diego CA (US)
- Huilin Xu of Temecula CA (US)
- Abdelrahman Mohamed Ahmed Mohamed Ibrahim of San Diego CA (US)
- Ahmed Attia Abotabl of San Diego CA (US)
- Krishna Kiran Mukkavilli of San Diego CA (US)
- Hwan Joon Kwon of San Diego CA (US)
- H04B7/06
- H04B17/336
- H04L5/00
- H04L5/14
- H04W76/19