18539149. DEVICE AND CORE LOSS CHARACTERIZATION METHOD FOR SCREENING CIRCUIT BREAKER SENSORS simplified abstract (Schneider Electric USA, Inc.)
Contents
DEVICE AND CORE LOSS CHARACTERIZATION METHOD FOR SCREENING CIRCUIT BREAKER SENSORS
Organization Name
Inventor(s)
Juan Ignacio Melecio Ramirez of North Liberty IA (US)
Collin Richard Fischels of Independence IA (US)
Kenneth Riehl of North Liberty IA (US)
DEVICE AND CORE LOSS CHARACTERIZATION METHOD FOR SCREENING CIRCUIT BREAKER SENSORS - A simplified explanation of the abstract
This abstract first appeared for US patent application 18539149 titled 'DEVICE AND CORE LOSS CHARACTERIZATION METHOD FOR SCREENING CIRCUIT BREAKER SENSORS
The abstract of this patent application describes a system for characterizing core loss for an electronic component, including a core loss module and an electronic device.
- Core loss module is coupleable to a current source and includes a nest for the device under test (DUT).
- Electronic device receives output from the core loss module and determines core loss, inductance, or permeability associated with the DUT.
Potential Applications: - Testing and characterization of electronic components in various industries such as electronics, automotive, and telecommunications. - Quality control and performance optimization of electronic devices.
Problems Solved: - Efficient and accurate characterization of core loss in electronic components. - Streamlining the testing process for electronic devices.
Benefits: - Improved understanding of core loss in electronic components. - Enhanced performance and reliability of electronic devices. - Cost-effective testing and characterization methods.
Commercial Applications: - Manufacturers of electronic components and devices can use this technology to ensure quality and performance standards are met. - Testing laboratories can offer specialized services for core loss characterization in electronic components.
Questions about the Technology: 1. How does the system accurately determine core loss in electronic components? 2. What are the potential implications of using this technology in the electronics industry?
Frequently Updated Research: - Stay updated on advancements in core loss characterization techniques and applications in various industries.
Original Abstract Submitted
In accordance with at least one aspect of this disclosure, a system for characterizing core loss for an electronic component can include a core loss module coupleable to a current source, the core loss module including a nest configured to receive the device under test (DUT). In certain embodiments, the system can include an electronic device configured to receive output corresponding to the core loss module and configured to perform at least one operation to determine one or more of core loss, inductance, or permeability associated with the DUT.
