18539141. APPARATUSES, SYSTEMS, AND METHODS FOR SCREENING ELECTRONIC COMPONENTS simplified abstract (Schneider Electric USA, Inc.)

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APPARATUSES, SYSTEMS, AND METHODS FOR SCREENING ELECTRONIC COMPONENTS

Organization Name

Schneider Electric USA, Inc.

Inventor(s)

Juan Ignacio Melecio Ramirez of North Liberty IA (US)

Collin Richard Fischels of Independence IA (US)

Kenneth Riehl of North Liberty IA (US)

Jeremy D. Schroeder of Cedar Rapids IA (US)

APPARATUSES, SYSTEMS, AND METHODS FOR SCREENING ELECTRONIC COMPONENTS - A simplified explanation of the abstract

This abstract first appeared for US patent application 18539141 titled 'APPARATUSES, SYSTEMS, AND METHODS FOR SCREENING ELECTRONIC COMPONENTS

The patent application describes a system that includes a device under test, a body with multiple conductors, a rotation section, a probe connected to the rotation section, a nest with at least one terminal, and an opening in the device under test for the probe to pass through.

  • The system involves a device under test, a body with multiple conductors, a rotation section, a probe, and a nest with at least one terminal.
  • The probe is designed to house some of the conductors and can pass through an opening in the device under test.
  • The nest is configured to connect to the device under test and allow the probe to pass through the opening.
  • This system enables testing and analysis of the device under test without interference from the conductors.
  • The design allows for efficient and accurate testing procedures.

Potential Applications:

  • Quality control testing in manufacturing processes.
  • Circuit testing in electronic devices.
  • Research and development in various industries.

Problems Solved:

  • Interference from conductors during testing.
  • Inefficient testing procedures.
  • Lack of accurate data collection.

Benefits:

  • Improved testing accuracy.
  • Enhanced efficiency in testing processes.
  • Reduced risk of errors in data collection.

Commercial Applications:

  • Manufacturing quality control systems.
  • Electronic device testing equipment.
  • Research and development tools for various industries.

Questions about the technology: 1. How does the system ensure accurate data collection during testing? 2. What industries can benefit the most from this testing system?


Original Abstract Submitted

A system may include a device under test, a body having a plurality of conductors, a rotation section, a probe associated with the rotation section, the probe configured to house at least a portion of one or more of the plurality of conductors, and a nest having at least one terminal, the nest configured to couple to the device under test and to permit at least a portion of the probe to pass through an opening of the device under test.

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